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displacement measuring
To reduce or eliminate speckle noise, we developed a new optical stylus profiling system consisting of a displacement measuring part using a knife-edge and a speckle noise measurement part.
      
The resolution of this (combined) displacement measuring method was assessed on translation and uniaxial tensile tests to be 5 nm for in-plane displacement components and 1.5 nm for out-of-plane motion over the same area.
      
Operation of conventional displacement measuring interferometers requires a co-operative target and an accurate alignment procedure.
      
This unit is used as the blade displacement measuring sensor of our wafer slicing machines.
      
This estimate presumes that a tension test frame, having associated load and displacement measuring capabilities, is available.
      
The transient motion of the sliders was measured by using an Opto-Follow which is an optical displacement measuring instrument.
      
 

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