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电子剥离     
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  electronic stripping
     The Electronic Stripping Tester's Design and Analysis of the Reliability
     电子剥离试验机的研制和可靠性分析
短句来源
     In this paper, we present the research and design of the Electronic stripping tester and analysis the reliability of the tester.
     本文研究设计了电子剥离试验机,并对其可靠性进行了分析。
短句来源
  electron stripping
     CALCULATION OF ELECTRON STRIPPING COROSS SECTION
     电子剥离截面的计算
短句来源
     n the text electron stripping cross sections of multiply charged ions by collision with neutral atoms and momentum distribution function of electron in the ion are calculated. 
     计算了多电荷离子与中性原子碰撞的电子剥离截面以及电子动量分布。
短句来源
  “电子剥离”译为未确定词的双语例句
     Single-Electron-Loss Cross-Section Measurements of 6~30 keV Singly-Charged Ions Impacting on H_2
     6~30keV单电荷离子与H_2分子碰撞的单电子剥离截面的测量
短句来源
     Experimental studies on single-electron-loss of 6-30keV B~+, C~+, N~+ and O~+ impacting on H_2
     6-30keV B~+、C~+、N~+、O~+与H_2碰撞单电子剥离的实验研究
短句来源
     NUMERICAL INVESTIGATION FOR ELECTRONIC MOMENTUM DISTRIBUTION AND ELECTRONIC
     多电荷离子的电子动量分布和电子剥离截面的数值研究
短句来源
     The single-electron-loss cross sections for 6- 30keV B+, C+, N+ and O+impacting on H2 have been measured, for the first time, using the growth-rate method. The cross sections of B+ and C+ as functions of ion energy in the region of 6 - 30keV from the present measurements can join smoothly to those in the 100-2500keV region from previous measurements.
     用增长率方法首次测量了6-30keVB+、C+、N+、O2与H2碰撞的单电子剥离截面,给出的B+和C+的6-30keV能区截面随离子能量的变化趋势与已有的100-2500keV能区截面的变化趋势衔接得很好。
短句来源
     The single-electron loss cross sections for 6~30 keV He+, Ne+, Ar+, Kr+, Xe+ and Cl+ impacting on H2 were measured using the growth-rate method. The present cross-section data of He+ are in good agreement with others' measurements. The other cross-section data of this work are reported for the first time.
     用增长率方法测量了6~30keVHe+,Ne+,Ar+,Kr+,Xe+及CI+离子与H2分子碰撞的单电子剥离截面.He+的截面数据与他人数据一致,其他的截面数据在此之前未见报道.
短句来源
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  相似匹配句对
     CALCULATION OF ELECTRON STRIPPING COROSS SECTION
     电子剥离截面的计算
短句来源
     The Electronic Stripping Tester's Design and Analysis of the Reliability
     电子剥离试验机的研制和可靠性分析
短句来源
     Electronic leveler
     电子水平仪
短句来源
     Electronic endoscopy
     电子内窥镜
短句来源
     stripping the social function;
     剥离社会职能 ;
短句来源
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  electron loss
It is demonstrated that the main factor defining the electron loss in magnetic traps in the collisionless limit is the departure of fast electrons from magnetic traps to the boundaries of the structure among other things.
      
The electron loss and electron capture cross sections σi,i+m and σi,i-m for boron ions and atoms traveling at the velocities V=1.19 and 1.83 a.u.
      
It is found that the electron loss cross sections can be described by a formula which was previously derived in the free-collision approximation and takes into account features of both the ions and the ambient atoms.
      
Our computational results for the cross section for electron loss are in good agreement with existing experimental data.
      
The model developed is used to calculate the cross sections σΣ and characteristic scattering angles θc for the process of electron loss by H- ions with energy E = 0.1-100 MeV in targets consisting of atoms with Z = 2-54.
      
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  electron-loss
Fragmentation of polyatomic ions produced by electron-loss collisions of butane and isobutane molecules with ions of kiloelectro
      
The excitation process of energetic ions, reflected at grazing angles from a metallic target, is assumed to be an electron-loss-capture-sequence.
      
Determination of electron-loss cross sections for negative hydrogen ions in gases using polarized projectiles
      
The Mn L2,3 electron-loss near-edge structure (ELNES) of these edges provided a sensitive fingerprint of its valence.
      
Evidence for a reaction between aluminium and SiO2 film is presented using Auger electron spectroscopy (AES) and low-energy electron-loss spectroscopy (ELS) techniques.
      
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