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半宽度
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  half width
    Thus,the relation between the apparent half width △λ_M and the true half width △λ_(1/2) measured by F-P etalon with different F factor and different optical thickness nt is obtained.
    由此,获得了用不同F值,不同光学厚度nt的F-P标准具所测得的表观半宽度⊿λ_M与实际半宽度⊿λ_(1/2)之间的关系。
短句来源
    From the set of figures,true half width △λ_(1/2) can be obtained from the measured half width △λ_M.
    利用这组图形,可以通过测量获得的半宽度⊿λ_M求出实际半宽度⊿λ_(1/2)。
短句来源
    The spatial resolution of system can be measured directly or evaluated indirectly by the half width of the Fresnel reflection at the end of the fiber.
    系统的空间分辨率既可以直接测量,也可以通过测量光纤末端菲涅尔反射的半宽度来间接测量。
短句来源
  “半宽度”译为未确定词的双语例句
    The principle and the approach of accurate measuring the displacement of plate using CCD camera are stated in this paper. They come down to the accurate measuring of pixel position on CCD. To do so,we have designed the circuits for measuring the time between the front edge of SCAN and fall edge of light spot pulse,and the halfwidth of light spot image pulse.
    论述了用CCD摄象机进行精密测量平板位移的原理及方法.归结为对CCD上象点的位置进行精确测量,为此设计了从SCAN脉冲前沿到光斑后沿间的距离以及光斑象脉冲半宽度的测量电路.并用线阵CCD测量了金属板的位移.实验结果表明,电路设计是合理可靠的.
短句来源
    The results from simulation and measurement for the displacement field of object to be stretched indicate that this method is feasible. The semi-width of recognition peak is sharpened from 4~5pixels to 1pixel and the Fractional Correlation peaks can be optimized by choosing the transform orders and phase modulation function.
    编程模拟和对拉伸试件位移场测量的结果表明,只要选择合适的分数傅里叶变换级次和相位调制函数,可以使相关峰的半宽度从4~5pixel锐化到仅1pixel,得到优于傅里叶变换相关的理想输出。
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  half width
The size distribution of particles is estimated, and dependences of its maximum and half width on the deposition potential are determined.
      
The particle size and half width of the particle distribution are also increased with the addition of TiB2 increasing from 0 to 20wt%.
      
From these results the increase in half width of an infinitely fine primary electron beam (δ-function response) is computed and plotted.
      
Triple Laue-rocking curves show a very narrow central peak whose half width is in the order of 0.001 sec of arc.
      
The size dependence of the half width and of the plasma frequency is compared to known models.
      
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On measuring the spectral linewidth by means of photographing the fringes of the F-P etalon,the influence of the instrument width on the measured results has been discussed.In case the spectrum of incident beam is a function of triangular form,we calculated the spectral distribution of transmission through the F-P etalon with a computer. Thus,the relation between the apparent half width △λ_M and the true half width △λ_(1/2) measured by F-P etalon with different F factor and different optical thickness nt is...

On measuring the spectral linewidth by means of photographing the fringes of the F-P etalon,the influence of the instrument width on the measured results has been discussed.In case the spectrum of incident beam is a function of triangular form,we calculated the spectral distribution of transmission through the F-P etalon with a computer. Thus,the relation between the apparent half width △λ_M and the true half width △λ_(1/2) measured by F-P etalon with different F factor and different optical thickness nt is obtained.The resulf of which is shown in the accompanying figures where is pleffed with △λ_M versus △λ_(1/2).From the set of figures,true half width △λ_(1/2) can be obtained from the measured half width △λ_M.On measuring the output linewidth of a dye laser pumped by N_2 laser with the method mentioned above,we have to consider the influences of the short pulses,which is equivalent to decrease the F factor of the F-P etalon used.For this purpose,we can correct it from the figure △λ_M versus △λ_(1/2) in the same manner.By changing the airgalps of F-P etalon ranging from 8mm,15mm and 30mm respectively,and measured the output linewidth near 6000(?) of the said dye laser pumped by N_2 laser,we have also made the corrections with the same Figure.Finally,we obtained the result as 0.025(?) and with discussion.

本文讨论了用F-P标准具的照相法测量光谱线宽时,仪器宽度对测量结果的影响。当入射光束频谱为三角形函数时,我们用计算机计算了透过F-P标准具以后的频谱分布。由此,获得了用不同F值,不同光学厚度nt的F-P标准具所测得的表观半宽度⊿λ_M与实际半宽度⊿λ_(1/2)之间的关系。所得结果用⊿λ_M~⊿λ_(1/2)图表示。利用这组图形,可以通过测量获得的半宽度⊿λ_M求出实际半宽度⊿λ_(1/2)。在用上述方法测量氮激光泵浦染料激光器输出线宽时,还必须考虑短脉宽的影响,它等效于降低了所用标准具的F值。因而,同样可用⊿λ_M~⊿λ_(1/2)图形进行修正。我们用一组空气间隙的厚度分别为8毫米,15毫米,30毫米的F-P标准具,测量了一台工作于6000■附近的氮激光泵浦染料激光器的输出线宽,并用上述图形进行修正。获得了0.025■的一致结果。最后.对此结果进行了讨论。

Data are sampled manually using a electromagnetic induction type underground metal pipe detectror. After that, an empirical formula for a metal pipe's second field distribution function is obtained by fitting the data. On the other band, the depth of underground metal pipe can be detected by use of the detector. Then, the pipe's diameter can be calculated by use of the half width of the distribution func-tion's curve and the depth. The error of the result is±10% of the pipe's diameter.

用现有的一台电磁感应式地下金属管线探测仪在现场进行人工数据采样,然后拟合出一个地下金属单管线二次场分布的经验公式,再用该分布函数曲线半宽度参数,伴以地下全属管线埋深的探测,便可探测出管径值,探测误差约为实际管径的±10%。

The principle and the approach of accurate measuring the displacement of plate using CCD camera are stated in this paper.They come down to the accurate measuring of pixel position on CCD.To do so,we have designed the circuits for measuring the time between the front edge of SCAN and fall edge of light spot pulse,and the halfwidth of light spot image pulse.We have also measured the displacement of metal plate using linear array CCD.According to the experimental results,the circuits are correct and practical....

The principle and the approach of accurate measuring the displacement of plate using CCD camera are stated in this paper.They come down to the accurate measuring of pixel position on CCD.To do so,we have designed the circuits for measuring the time between the front edge of SCAN and fall edge of light spot pulse,and the halfwidth of light spot image pulse.We have also measured the displacement of metal plate using linear array CCD.According to the experimental results,the circuits are correct and practical.

论述了用CCD摄象机进行精密测量平板位移的原理及方法.归结为对CCD上象点的位置进行精确测量,为此设计了从SCAN脉冲前沿到光斑后沿间的距离以及光斑象脉冲半宽度的测量电路.并用线阵CCD测量了金属板的位移.实验结果表明,电路设计是合理可靠的.

 
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