Characteristic X-ray energy spectrum analysis of a sample prepared by the method shows the depositing rate of Mn is close to that of Sb since the ratio of their atomic percent is nearly 1∶1.MnSb is found in the film by X-ray diffraction analysis,and hysteresis loop of the sample also proves the existence of MnSb in the film.
We present here an observational result for the hard X-ray spectrum of Cyg X-1 in 20-200 keV range, which was obtained by a balloon-borne CsI-NaI phoswich type telescope launched at Xianhe Balloon Facilities on Sep. 22, 1985. The X-ray luminosity in 10-200 keV is estimated as (1.07 ± 0.08) × 1037 ergs/s.
The characteristics of original surface film of brass HSn70-1A and its corrosion behavior in seawater were investigated by means of Auger electrical spectrum analysis and electric detective analysis of X ray spectrum,SEM,metallurgical microscope,mathematics regression analysis.
WT5”BZ]In the paper, the principle of the scattering technique was applied in measuring the total X ray dose and the filter fluorescence was applied in measuring the X ray spectrum on high temperature plasma was described. The method of dealing with the X ray spectrum and the total X ray dose was established. The result of the experiment was got successfully.
It was found that, during implosion of double multiwire arrays, more than 90% of the total energy corresponding to the soft X-ray spectrum were emitted from an area >amp;lt;500 μm in diameter.
The relative integral intensity of the last emission line in the characteristic X-ray spectrum is used as the first analytical signal.
The spectral intensity of the brightest (Kα, Lαand, less frequently, Mαor Mβ) lines of the characteristic X-ray spectrum serves as the second analytical signal, which is conventionally used in X-ray fluorescence analysis.
The ratios of the intensities in the X-ray spectrum were measured: , , , and .
The brightness distribution and X-ray spectrum of the SNR are obtained from archival ROSAT and ASCA X-ray data.
The prepared CdSe NCs were characterized by ultraviolet-visible spectra (UV-Vis), photoluminescence (PL), transmission electron micrograph (TEM), energy disperse X-ray spectra (EDX) and X-ray diffraction (XRD).
Rising the signal-to-noise ratio in X-ray spectra of femtosecond laser-produced plasmas using the "mean-median" algorithm
In turn, the noise signals of X-ray detectors grow in amplitude and the signal-to-noise ratio in recording X-ray spectra of multiply charged ions approaches unity.
The most powerful effect of the above factors is exerted on X-ray spectra recorded by such electromagnetic equipment as CCD-based detectors, photoelectron amplifiers, etc.
A new "mean-median" algorithm is described, with which it is possible to considerably increase the signal-to-noise ratio of CCD detectors used to measure X-ray spectra of femtosecond laser-produced plasma.