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零位标记
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  “零位标记”译为未确定词的双语例句
     Several quantitative drift measurement techniques for scanning probe microscopy(SPM) were introduced. A new method using two-dimensional zero-reference masks was proposed to measure the SPM drift.
     对扫描探针显微镜(SPM)仪器漂移的定量测量的几种方法进行探讨,提出应用二维零位标记进行漂移测量.
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     Results showe that when using zero-reference grating it is not sensitive to tip-induced artifacts in images and the measuring range is not affected by the width of grating element.
     结果表明:应用二维零位标记的测量技术对探针与样品形貌耦合引起的图像误差不敏感,漂移测量范围不受光栅单元尺寸影响.
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  相似匹配句对
     GENETIC ANALYSIS OF NULL ALLELIC RFLP MARKERS IN RICE
     水稻RFLP标记的遗传学研究
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     GISH analysis demonstrated that two E.
     标记E.
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     An Experimental Study on the Stability of Zero Position
     稳定性实验研究
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     Marked themes in English
     英语有标记
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     MARKED ZEROS ALGORITHM WITH PROGRAM SOFTWARE
     标记算法与程序软件
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  zero mark
Therefore, the system for normalizing the permissible error specified by GOST 8476-60 for the zero mark on the scale is, in our opinion, insufficiently characteristic of the instrument's metrological properties.
      
Instrument for testing the zero mark on mercury-glass thermometers with 0.01?C scale divisions
      
Assignments that are submitted late will be awarded a zero mark unless the course coordinator is satisfied that an extension is warranted.
      
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Several quantitative drift measurement techniques for scanning probe microscopy(SPM) were introduced.A new method using two-dimensional zero-reference masks was proposed to measure the SPM drift.Four techniques used in drift measurement were compared.They were based on imaging normal sample,periodical regular pattern,zero-reference mask and atomic grating respectively.Results showe that when using zero-reference grating it is not sensitive to tip-induced artifacts in images and the measuring range is not affected...

Several quantitative drift measurement techniques for scanning probe microscopy(SPM) were introduced.A new method using two-dimensional zero-reference masks was proposed to measure the SPM drift.Four techniques used in drift measurement were compared.They were based on imaging normal sample,periodical regular pattern,zero-reference mask and atomic grating respectively.Results showe that when using zero-reference grating it is not sensitive to tip-induced artifacts in images and the measuring range is not affected by the width of grating element.Thus,this method is superior to the one based on imaging normal samples or regular patterns,while using atomic grating could be expected to obtain sub-atomic resolution for drift measurement.

对扫描探针显微镜(SPM)仪器漂移的定量测量的几种方法进行探讨,提出应用二维零位标记进行漂移测量.分析比较使用普通样品、周期二维光栅、二维零位标记和原子光栅在测定仪器漂移中的优缺点.结果表明:应用二维零位标记的测量技术对探针与样品形貌耦合引起的图像误差不敏感,漂移测量范围不受光栅单元尺寸影响.该方法优于采用普通样品和规则周期的二维光栅样品的方法,而应用原子光栅可以预计达到亚原子量级的超高精度的SPM漂移测量.

 
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