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fourier过滤技术
相关语句
  fourier filtering technique
     FOURIER FILTERING TECHNIQUE APPLICATION TO THE STRUCTURE ANALYSIS IN SEMICRYSTALLINE POLYETHYLENE TEREPHTHANLATE
     Fourier过滤技术在半结晶高聚物两相共存结构分析中的应用
短句来源
     In conclusion,it is a very effective method that the combination based on the Fourier filtering technique and the full pattern diffraction least squares refinement (Rietveld method) and the radial distribution function analyses to study the two phase structure in semi crystalline polymers.
     据此对半结晶PET2 的二相共存结构进行了表征 . 研究表明 ,联用Rietveld方法、Fourier过滤技术和径向分布函数 (RDF)分析这一综合手段 ,是探讨半结晶高聚物二相共存结构的一个有效的新途径
短句来源
     It is important that radial distribution function(RDF) calculated according to scattering intensity for non _ crystalline phase is reaso_nable besides reliable refined structural parameters for crystalline phase judged by R factors, when structural parameters for two phases in semi _ crystalline polymer of poly(ethylene terephthalate) are investigated by combining Rietveld method, Fourier filtering technique and RDF.
     特别指出 ,当把Rietveld法和Fourier过滤技术及径向分布函数 (radialdistributionfunction,RDF)联用来研究半结晶聚酯 (PET)的两相结构参数时 ,除需用R因子判断结晶相之精修结构参数的可靠性外 ,还要判断由非晶相散射强度数据计算的RDF是否合理 ; 如果忽视后一判据 ,则有可能导致错误的计算结果。
短句来源
  “fourier过滤技术”译为未确定词的双语例句
     The X-ray diffraction whole pattern (XDWP) data of semi-crystalline poly (ethylene terephthalate) PET_2 sample were collected in the symmetric reflection geometry on a diffractometer employing a copper target (λ_(Kα)=(0.15418) nm).
     联用Rietveld方法和Fourier过滤技术,首先以标准试样PbSO4的实测X射线衍射全谱图数据进行精修和分离,获得其结晶相结构参数和低本底值。
短句来源
  相似匹配句对
     Filtration Technology and Facilities
     过滤技术及装置
短句来源
     Air nitration techenologies for dust collection
     过滤除尘技术
短句来源
     Technology;
     技术
短句来源
     TECHNOLOGY
     技术
短句来源
     FOURIER FILTERING TECHNIQUE APPLICATION TO THE STRUCTURE ANALYSIS IN SEMICRYSTALLINE POLYETHYLENE TEREPHTHANLATE
     Fourier过滤技术在半结晶高聚物两相共存结构分析中的应用
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  fourier filtering technique
Fourier filtering technique is used to increase the contrast of fringes and to multiple the fringes.
      
To actually image the defects giving rise to the enhanced small-angle scattering, we apply a Fourier filtering technique.
      


The X ray diffraction whole pattern (XDWP) data of semicrystalline poly (ethylene terephthalate) PET 2 sample were collected in the symmetric reflection geometry on a diffractometer, employing a copper target ( K α wavelength=0.15418nm).The XDWP was fitted by combining the Rietveld method and Fourier filtering technique,Rietveld structure refinement for PET 2 crystalline phase was done,the unit cell parameters obtained being a=0.445,b=0.592,c=1.072 nm, α=99.6,β=116.9,γ= 111.9 (°),and the density...

The X ray diffraction whole pattern (XDWP) data of semicrystalline poly (ethylene terephthalate) PET 2 sample were collected in the symmetric reflection geometry on a diffractometer, employing a copper target ( K α wavelength=0.15418nm).The XDWP was fitted by combining the Rietveld method and Fourier filtering technique,Rietveld structure refinement for PET 2 crystalline phase was done,the unit cell parameters obtained being a=0.445,b=0.592,c=1.072 nm, α=99.6,β=116.9,γ= 111.9 (°),and the density of the sample being d c=1.495(g/cm 3).Meanwhile, the XDWP was separated into two parts,CR 2 crystalline region and AM 2 non crystalline region in PET 2.The reduced radial distribution function G 2(r) was calculated from AM 2, finding three main peaks, G 21 (r)=0.150,G 22 (r)=0.254,G 23 (r)=0.460 nm, which characterize the structure of the non crystalline phase in PET 2.We suggest that the amorphous curve is best taken as the sum of several non crystalline scattering peaks.Reliability and reasonableness of the structural parameters of the crystalline phase and the non crystalline phase are discussed.In conclusion,it is a very effective method that the combination based on the Fourier filtering technique and the full pattern diffraction least squares refinement (Rietveld method) and the radial distribution function analyses to study the two phase structure in semi crystalline polymers.

采用X射线衍射对称反射法 ,对半结晶聚酯PET2 试样收集粉末X射线衍射全图 (XDWP)数据 ,用Rietveld方法和Fourier过滤技术 ,对XDWP拟合并分离成结晶衍射峰之和CR2 和非晶散射峰之和AM2 两部分 ,与此同时获得PET2 试样的结晶相CR2 的三斜晶系晶胞参数 :a =0 .44 5 ,b =0 .5 92 ,c =1.0 72nm ,α =99.6 ,β =116 .9,γ =111.9(°) ,结晶密度dc=1.495 (g cm3) .然后由AM2 计算的约化径向分布函数G2 (r) ,得到表征非晶相结构的 3个主峰G2 1 (r)=0 .15 0 ,G2 2 (r) =0 .2 5 4,G2 3(r) =0 .46 0 (nm) .提出用“B个非晶散射峰At 之和”表达非晶相的散射曲线 ,并就PET2试样二相共存时的结晶相和非晶相的结构参数的可靠性和合理性进行了全面的诠释 .据此对半结晶PET2 的二相共存结构进行了表征 .研究表明 ,联用Rietveld方法、Fourier过滤技术和径向分布函数 (RDF)分析这一综合手段 ,是探讨半结晶高聚物二相共...

采用X射线衍射对称反射法 ,对半结晶聚酯PET2 试样收集粉末X射线衍射全图 (XDWP)数据 ,用Rietveld方法和Fourier过滤技术 ,对XDWP拟合并分离成结晶衍射峰之和CR2 和非晶散射峰之和AM2 两部分 ,与此同时获得PET2 试样的结晶相CR2 的三斜晶系晶胞参数 :a =0 .44 5 ,b =0 .5 92 ,c =1.0 72nm ,α =99.6 ,β =116 .9,γ =111.9(°) ,结晶密度dc=1.495 (g cm3) .然后由AM2 计算的约化径向分布函数G2 (r) ,得到表征非晶相结构的 3个主峰G2 1 (r)=0 .15 0 ,G2 2 (r) =0 .2 5 4,G2 3(r) =0 .46 0 (nm) .提出用“B个非晶散射峰At 之和”表达非晶相的散射曲线 ,并就PET2试样二相共存时的结晶相和非晶相的结构参数的可靠性和合理性进行了全面的诠释 .据此对半结晶PET2 的二相共存结构进行了表征 .研究表明 ,联用Rietveld方法、Fourier过滤技术和径向分布函数 (RDF)分析这一综合手段 ,是探讨半结晶高聚物二相共存结构的一个有效的新途径

The X-ray diffraction whole pattern(XDWP )data of semicrystalline poly(ethylene terephthalate)PET 2 sample were collected in the symmetr ic reflection geometry on a diffractometer employing a copper target(K α wavelength 0.15418nm)(see Fig.1).The XDWP was fitted by combining the Rietveld method and Fourier filtering technique,Rietveld stru cture refinement for PET 2 crystalline phase was performed,th e unit-cell parame-ters obtained are a=0.445nm,b=0.592nm,c=1.072nm,α=99.6(°),β=116.9(°),γ=111.9(°),the...

The X-ray diffraction whole pattern(XDWP )data of semicrystalline poly(ethylene terephthalate)PET 2 sample were collected in the symmetr ic reflection geometry on a diffractometer employing a copper target(K α wavelength 0.15418nm)(see Fig.1).The XDWP was fitted by combining the Rietveld method and Fourier filtering technique,Rietveld stru cture refinement for PET 2 crystalline phase was performed,th e unit-cell parame-ters obtained are a=0.445nm,b=0.592nm,c=1.072nm,α=99.6(°),β=116.9(°),γ=111.9(°),the density of the crystals is d c =1.495g ·cm -3 (see Table 1).Meanwhile the XDWP was separated in to two parts,CR2crystalline region and AM2non-c rystalline region in PET2(see Fig.2).The reduced radial distribution fu nc-tion G2(r)was calculated from AM2and lead to th ree main peaks,G21(r)=0.150nm,G22(r)=0.254nm,G23(r)=0.460nm which characterize the str ucture of the non-crystalline phase in PET2(see Fig.3).The result shows that this combination of techn iques is feasible.The auther suggests that the reliability of evaluatio n on two phases separation and structure analysis in semicrystalline polymer,besides the three criteria to estimate the pa-rameters of the crystalline phase,also depends on other two new physical criteria.Effect of various fitting plans on the results of structure refinement and phase separation were discussed.It is shown that in order to get relia ble re-sults it is necessary to have scattering pattern of pure amorphous sample as initial values of background inte nsity in fitting process.This work discusses how to deal with t he difficulties and its possible sol utions in applying Rietveld method t o polymer structure analysis.

联用Rietveld方法、Fourier过滤技术和径向分布函数(RDF)研究了半结晶聚酯(PET)粉末样的结晶相和非晶相两相分离及结构分析问题,得到合理的结晶相和非晶相的结构参数,表明这种方法对分析半结晶高聚物的两相结构是可行的.文中提出,判断半结晶高聚物二相分离和结构分析是否可靠,除需考虑分辩结晶相结构参数是否正确的三个判据之外,还需加上二个物理判据.还指出,若要获得合理的两相分离结果,提供纯非晶试样的散射曲线作为拟合时本底强度初始值是必要的.

Rietveld method was employed for the refinement of X _ ray diffraction whole pattern(XDWP) data of BaF2 sample. Correct unit _ cell parameters of BaF2 were obtained. How to decide the diffraction profile function and evaluate the reliability of refined structural parameters were the main points discussed. It is important that radial distribution function(RDF) calculated according to scattering intensity for non _ crystalline phase is reaso_nable besides reliable refined structural parameters for crystalline...

Rietveld method was employed for the refinement of X _ ray diffraction whole pattern(XDWP) data of BaF2 sample. Correct unit _ cell parameters of BaF2 were obtained. How to decide the diffraction profile function and evaluate the reliability of refined structural parameters were the main points discussed. It is important that radial distribution function(RDF) calculated according to scattering intensity for non _ crystalline phase is reaso_nable besides reliable refined structural parameters for crystalline phase judged by R factors, when structural parameters for two phases in semi _ crystalline polymer of poly(ethylene terephthalate) are investigated by combining Rietveld method, Fourier filtering technique and RDF.

用Rietveld法对试样BaF2 的实测X射线衍射全谱图 (XDWP)数据进行精修 ,获得正确的结晶相结构参数 ,重点讨论了如何正确选择衍射峰型函数和评价精修结构参数的可靠性 ;特别指出 ,当把Rietveld法和Fourier过滤技术及径向分布函数 (radialdistributionfunction,RDF)联用来研究半结晶聚酯 (PET)的两相结构参数时 ,除需用R因子判断结晶相之精修结构参数的可靠性外 ,还要判断由非晶相散射强度数据计算的RDF是否合理 ;如果忽视后一判据 ,则有可能导致错误的计算结果。

 
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