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可靠性评价方法
相关语句
  reliability evaluation method
    Application Investigation in the Reliability Evaluation Method of Vacuum Electron Display devices(CRT)
    真空电子显示器件(CRT)可靠性评价方法的应用研究
短句来源
  “可靠性评价方法”译为未确定词的双语例句
    Application Investigation on the Reliablity Evaluation Method of Vacuum Electron Display Devices
    真空电子显示器件(CRT)可靠性评价方法的应用研究
短句来源
    The conventional reliability evaluation of lifetime tests is limited with the development of electron devices toward excellent performance,small size and high reliability.
    随着电子器件朝着高性能、小尺寸和长寿命方向发展,传统的寿命试验可靠性评价方法的局限性日益显著。
短句来源
    The conventional reliability evaluation of lifetime tests in limited with the development of electron devices toward excellent performance,small size and high reliability.
    随着电子器件朝着高性能、小尺寸和长寿命方向发展 ,传统的寿命试验可靠性评价方法的局限性日益显著。
短句来源
    The article analyses trouble mechanism of semiconductor; and presents a method of Evaluating to reliability and some examples.
    文章分析了半导体器件中的故障机理,提出相应的可靠性评价方法,并给出一些评价实例
短句来源
    Research progress of lead-free solder,invalidation models of solder joint,solder joint reliability evaluation and the defects of solder joints in recent years have been reviewed.
    笔者就近年来国内外开发的无铅焊料、焊点的失效模式、焊点可靠性评价方法和焊点的主要缺陷进行了综述;
短句来源
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The conventional reliability evaluation of lifetime tests is limited with the development of electron devices toward excellent performance,small size and high reliability.It is shown from a lot of recent evidences that noise in electron devices is a sensitive measure of various reliabilitydependent defects,and hence noise measurement is expected to be a general,fast and nondestructive tool to characterize reliability in these devices.A review of recent development on the new technique is presented in this papar....

The conventional reliability evaluation of lifetime tests is limited with the development of electron devices toward excellent performance,small size and high reliability.It is shown from a lot of recent evidences that noise in electron devices is a sensitive measure of various reliabilitydependent defects,and hence noise measurement is expected to be a general,fast and nondestructive tool to characterize reliability in these devices.A review of recent development on the new technique is presented in this papar.

随着电子器件朝着高性能、小尺寸和长寿命方向发展,传统的寿命试验可靠性评价方法的局限性日益显著。近年来得到的大量研究结果表明,对于大多数电子器件,噪声是导致器件失效的各种潜在缺陷的敏感反映,噪声检测方法以其灵敏、普适、快速和非破坏性的突出优点,正在发展成为一种新型的电子器件可靠性表征工具。本文对该领域目前的研究进展做了概括性的评述。

Traditional reliability evaluating methods usually put products under typical fixed conditions,and for changeable working conditions,there is no effective way up to now.By mapping qualitative linguistic word into quantitative values using cloud models,this paper proposes a new evaluating way showing lifetime difference of products under different working conditions.It may solve the reliability evaluation problems of electric products working in changeable conditions.

传统的可靠性评价方法一般限定产品工作于一个或几个典型的不变的条件下 ,对工作条件可变的情况 ,目前尚缺少有效的方法 本文采用云模型 ,通过对定性的环境因素语言描述进行定量不确定转换 ,建立产品的环境适应性模型和工作条件模型 ,反映工作条件的改变对产品寿命的影响 ,并在此基础上 ,提出了考虑可变工作条件影响的电子产品可靠性评价方法 ,解决了可变工作条件下电子产品的可靠性评价问题

Based on analyzing the shortcomings of the traditional methods for evaluating the quality and reliability of electronic parts,a new technique is introduced This new technique focuses on evaluating the building in quality of electronic parts using the following three parameters:C pk (Process capability ratio),SPC(Statistical Process Control),and PPM(Parts Per Million),and is widely used by many famous international companies The electronic parts users could select the high quality parts with this technique,and...

Based on analyzing the shortcomings of the traditional methods for evaluating the quality and reliability of electronic parts,a new technique is introduced This new technique focuses on evaluating the building in quality of electronic parts using the following three parameters:C pk (Process capability ratio),SPC(Statistical Process Control),and PPM(Parts Per Million),and is widely used by many famous international companies The electronic parts users could select the high quality parts with this technique,and the electronic parts manufacturers could improve the quality of their products according to the evaluating requirements

在分析常规可靠性评价方法存在问题的基础上 ,介绍目前国际上广泛采用的元器件内在质量评价技术和具体要求。整机生产厂可借鉴此技术 ,考虑采用进一步保证元器件质量和可靠性的有效方法。元器件生产厂家也可以根据评价要求 ,考虑如何改进产品设计和工艺控制 ,与国际要求接轨 ,尽早将产品打入国际市场。

 
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