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荧光x射线
相关语句
  fluorescent x-ray
     STUDY ON T. SHIRAIWA AND N. FUJINO'S EQUATIONS OF FLUORESCENT X-RAY INTENSITY
     关于T.Shiraiwa与N.Fujino的荧光X射线强度公式的研究
短句来源
     Automatic Control of Catalyst Concentration in PTA Unit Based on Fluorescent X-ray Analyzer
     利用荧光X射线分析仪实现PTA装置催化剂质量浓度自动控制
短句来源
     For the fluorescent X-ray tubes, several spectral distributions of different directions of primary X-ray beam must be determined and then the mean values of these data are calculated in order to obtain the effective spectral distributions.
     对荧光X射线管还应测定几个射线束方向的原级谱加以平均求得有效原级谱。
短句来源
     The requirement of oxidizing reaction is satisfied. The emphases are to introduce the principle,configuration of fluorescent X-ray analyzer and the makeup of automatic control system of catalyst concentration.
     重点说明荧光X射线在线催化剂分析仪的工作原理、组成及催化剂质量浓度自动控制系统组成。
短句来源
  “荧光x射线”译为未确定词的双语例句
     The fluorescence X-ray absorption fine structure(XAFS) technique was used to study the diffusion effect of self-assembled Ge/Si(001) quantum dots grown by molecular beam epitaxy(MBE).
     利用荧光X射线吸收精细结构(X-ray absorption fine structure,XAFS)方法研究了分子束外延生长的自组装Ge/Si(001)量子点的扩散效应.
短句来源
     Some vague doubtful points, such us physical meanings of (dx_1)/sinψ, (dx_2)/sinψ and (2πr_1dr_1)/(4πR_1~2), are clarified. Their two mistakes and causes of mistakes are shown, and corrections are given.
     Fujino推导荧光X射线强度公式的思路,解决了dx_1/sinψ、dx_2/sinψ及(2πr_1dr_1)/(4πR_1~2)等项的物理意义含糊不清的疑团,指出了他们的两个错误及出错的原因,并作了恰当的相同校正。
短句来源
     The local structures of Pt thin films grown by molecular beam epitaxy with the thickness range from 3 to 105 nm have been studied by the grazing incidence fluorescence XAFS technique.
     利用荧光 X 射线吸收精细结构(XAFS)技术研究了厚度为 3—105 nm 范围的分子束外延生长的 Pt 金属薄膜的局域结构。
短句来源
     Electron spin resonance (ESR) which is proved to be an effective method for the oxidation state analysis of AZS products was used to investigate the valence of iron and titanium in fused cast AZS. The coordination state of Al~(3+), Fe~(3+) and B~(3+) was studied by X-ray fluorescopy, ESR and IR respectively.
     利用电子自旋共振谱(EsR)、荧光X射线化学位移法和红外光谱等实验方法,分析了电熔铬刚玉砖(简称AZS)玻璃相中铁、钛的价态以及Fe~(3+),Al~(3+),B~(3+)的配位态随氧化程度的变化规律。
短句来源
     The Laue detector is a new type of fluorescence XAFS detector, which has advantages of good energy resolution, high counting rate and big acceptance area.
     劳埃(Laue)型荧光X射线吸收精细结构(XAFS)探测器是一种新型的探测器,它具有能量分辨好、计数率高和接收面积较大等优点,对于高光通量场合的痕量元素XAFS实验具有很高的灵敏度,有很好的应用前景。
短句来源
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  相似匹配句对
     X-ray Fluorescence Tomography
     X射线荧光层析
短句来源
     Today's X-ray Fluoremetry
     现代X射线荧光分析
短句来源
     the X-rayfluorescence well-logging;
     互射线荧光测井;
短句来源
     Total reflection X-ray fluorescence analysis
     全反射X射线荧光分析
短句来源
     Advances of x-ray fluorescence spectrometers
     X射线荧光光谱仪的进展
短句来源
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  fluorescent x-ray
Fluorescent X-ray transport in microchannel plates
      
The present method also allows us to calculate the Auger electron and fluorescent X-ray photon emission intensity in the natural way.
      
Analysis of alloys by fluorescent X-ray spectroscopy
      
Analyses using energy-dispersive fluorescent X-ray analysis and powder X-ray diffractometry confirm alloying of Pt with Ni in a range of compositions.
      
Finally, the author shows how to apply a double-crystal monochromator unit (using analyzing crystals of germanium (111)) in fluorescent X-ray emission analysis, especially for an X-ray quantometer.
      
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103 samples of airborne particles were collected at 9 different sites in Beijing area by using Hi-volume air sampler and analyzed for 21 elements by x-ray fluorescence, atomic absorption spectrometry and ICP. In some of the samples phase analysis of α-SiO2 and CaCO3 was done by X-ray diffraction method.

选择北京地区7—9个采样点(五个功能区),用大容量采样器按季定期采集飘尘样品(103个)。用x射线荧光、x射线衍射、原子吸收、等离子体发射光谱等方法分析了飘尘中21种元素,并鉴定了α-SiO_2(α-石英)和CaCO_3(方解石)的物相。用元素相对浓度(x/Fe或x/Si)和富集因子(EF地壳以Fe为参比元素)进行了数据处理与分析,阐明了北京大气飘尘的化学特性以及不同地区、不同季节的差异与变化。根据分析结果认为,北京地区飘尘中的主要化学组分大都来源于自然界风砂或土壤;在飘尘中富集最高的元素S、Zn、Pb等可能主要来自人为污染源。估算了飘尘中风砂所占比例约为33%、硫酸根约为6%。

In this paper, a method for quantitative determination of spectral distributions of primary radiation from X-ray tubes for diffraction and X-ray fluorescent spectral analysis is presented. The instrument used for this purpose is a diffractometer with a proportional-scintillation counter and a LiF analyzing crystal. The intensity distributions of primary X-ray spectrum obtained using a LiF analyzer are determined. The experimental values of the X-ray intensities of various wavelengths must be expressed in terms...

In this paper, a method for quantitative determination of spectral distributions of primary radiation from X-ray tubes for diffraction and X-ray fluorescent spectral analysis is presented. The instrument used for this purpose is a diffractometer with a proportional-scintillation counter and a LiF analyzing crystal. The intensity distributions of primary X-ray spectrum obtained using a LiF analyzer are determined. The experimental values of the X-ray intensities of various wavelengths must be expressed in terms of intensities just emitted from the X-ray tube window. For the fluorescent X-ray tubes, several spectral distributions of different directions of primary X-ray beam must be determined and then the mean values of these data are calculated in order to obtain the effective spectral distributions. The errors of the spectral distribution data and its influence on the practical applications such as the fundamental parameter method are discussed.

本文提出了衍射或荧光分析用的X射线管原级X射线谱强度分布的定量测定方法。在带有正比、闪烁计数管的衍射仪上用LiF分光晶体进行展谱测定。实验测定强度经校正计算还原为X射线管窗口处的强度。对荧光X射线管还应测定几个射线束方向的原级谱加以平均求得有效原级谱。分析了原级X射线谱数据的误差及其对基本参数法等实际应用的影响。

The X-ray fluoremetry is one kind of the rapid nondestructive analytical methods, with simple operation, better accuracy and large analytical range.It isan important analytical method wich has found wide use in scientific research, geology, metalurgy and other fields.The experimental coefficient method and fundamental parameter method developing in this decade of years are two new kinds of the X-ray fluoremetry. It is performed with the aid of electronic computer,and gradually used for the analysis of the...

The X-ray fluoremetry is one kind of the rapid nondestructive analytical methods, with simple operation, better accuracy and large analytical range.It isan important analytical method wich has found wide use in scientific research, geology, metalurgy and other fields.The experimental coefficient method and fundamental parameter method developing in this decade of years are two new kinds of the X-ray fluoremetry. It is performed with the aid of electronic computer,and gradually used for the analysis of the components of complex substances and the thickness of thin films. Desirable resulfs have been btained.This paper describes the applications of the experimental coefficient method and foundamental Parameter method respectively, and the comparison between them is also made.

X射线荧光分析是快速非破坏性的检测方法,操作简便,准确度高,分析范围广.它已在科学研究、地质、冶金以及其它各部门,得到了广泛的应用,并成为一种重要的分析手段.实验系数法和基本参数法是近十几年发展起来的荧光X射线分析方法.它是借助于电子计算机来完成的,已逐步地用来测定复合物的含量和薄膜的厚度,并得到了良好的效果.本文根椐已有的资料,分别阐述了实验系数法和基本参数法的应用,并对它们进行了比较.

 
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