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接触模式
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  “接触模式”译为未确定词的双语例句
    The optical characteristic of the index-guide, gain-guide laser diode array and the broad area laser diode is calculated using supermode theory and broad-area mode theory.
    本文通过超模理论和宽接触模式理论对折射率导引、增益导引半导体激光器列阵和宽接触条形半导体激光器输出激光的空间模式特性进行了研究。
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    Some solutions are proposed of the difficulties during scanning just as interference in the image, image drifting, periodic interference, scanning soft samples, and identifying mendacious images.
    比较了接触模式和动态模式(即轻敲模式)这两种扫描模式,说明动态模式在表面形貌测量中的突出优势; 对于扫描过程中遇到的图像表面的拖动、图像的漂移、周期性干扰、软性样品的扫描、假像的辨别等问题提出了一些解决方法;
短句来源
    The electronic processing system is a common-mode rejection system so that insensitive to intensity fluctuations of the light source and minimizes noise from electronic system.
    与接触模式工作的原子力显微镜相比扩大了测量范围。 电子处理共模抑制系统可有效地抑制光强波动和降低系统电子噪声。
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  contact mode
The K-Cu/ZrO2 catalyst was found to be the most active; it exhibited activity in a loose contact nearly similar to that obtained in a tight contact mode.
      
Scanning force microscopy images of the Si(111)7×7 surface reconstruction are presented which are taken in the contact mode in ultrahigh vacuum.
      
Images have been recorded on PMMA photo resists and analyzed using an atomic force microscope operating in contact mode.
      
Our AFM operates in the so-called contact mode and utilizes the optical-lever detection method which allows simultaneous measurement of the topography as well as the lateral force.
      
Calf skin type I collagen fibrils were regenerated from acidic solution and imaged with contact mode atomic force microscopy in air, water, and buffer solution.
      
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  contact mode
The K-Cu/ZrO2 catalyst was found to be the most active; it exhibited activity in a loose contact nearly similar to that obtained in a tight contact mode.
      
Scanning force microscopy images of the Si(111)7×7 surface reconstruction are presented which are taken in the contact mode in ultrahigh vacuum.
      
Images have been recorded on PMMA photo resists and analyzed using an atomic force microscope operating in contact mode.
      
Our AFM operates in the so-called contact mode and utilizes the optical-lever detection method which allows simultaneous measurement of the topography as well as the lateral force.
      
Calf skin type I collagen fibrils were regenerated from acidic solution and imaged with contact mode atomic force microscopy in air, water, and buffer solution.
      
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A novel double focus optical interferometer for scanning force microscope is presented in this paper. The deflection of the force sensing cantileveris measured by means of phase shift of two orthogonally polarized light beams. This arrangement minimizes perturbations arising from fluctuations of the optical path difference. The electronic processing system is a common-mode rejection system so that insensitive to intensity fluctuations of the light source and minimizes noise from electronic system. The instrument...

A novel double focus optical interferometer for scanning force microscope is presented in this paper. The deflection of the force sensing cantileveris measured by means of phase shift of two orthogonally polarized light beams. This arrangement minimizes perturbations arising from fluctuations of the optical path difference. The electronic processing system is a common-mode rejection system so that insensitive to intensity fluctuations of the light source and minimizes noise from electronic system. The instrument provided 0.1nm height resolution and 5um spatial resolution.

本文论述了一种用于超高分辨率精密检测技术的激光扫描力显微镜(SFM)。它是以一钨丝微探针作为力传感器,用双焦干涉仪作为光探针来检测样品扫描时微探针受力产生的偏摆。微探针以谐频振动,当样品与探针距离变化引起力梯度改变,谐频变化则振幅也随之变化。该振幅变化可由干涉光探针接收。光探针是一准共路干涉系统,可有效地抑制光程差的波动。而微探针采用谐振增强方式工作,来非接触地测试振幅变化进而得出样品表面微观轮廓。与接触模式工作的原子力显微镜相比扩大了测量范围。电子处理共模抑制系统可有效地抑制光强波动和降低系统电子噪声。对全息光栅及液晶等样品的实测结果表明仪器的横向分辨率为5um,纵向分辨率为0.1nm。

The single voxels mechanic property of material SCR500 is modeled and simulated by finite element analysis (FEA). The cantilever-voxels interaction force of variety elastic modulus is achieved. By measuring the mechanic property of single voxels with contact model of atomic force microscopy (AFM) and tipples cantilever, the cantilever-voxels interaction force in the same displacement is acquired. By comparing the measurement result with the simulation, the elastic modulus of single voxels is calculated. The...

The single voxels mechanic property of material SCR500 is modeled and simulated by finite element analysis (FEA). The cantilever-voxels interaction force of variety elastic modulus is achieved. By measuring the mechanic property of single voxels with contact model of atomic force microscopy (AFM) and tipples cantilever, the cantilever-voxels interaction force in the same displacement is acquired. By comparing the measurement result with the simulation, the elastic modulus of single voxels is calculated. The result indicates that the elastic modulus of single voxels is about 1/7 of elastic modulus of macro sample,which provides basic theory to improve the mechanical properties analysis of micro-devices made by two photon femtosecond laser fabrication.

采用有限元法对材料为SCR500的飞秒激光双光子成型点力学性能进行建模及仿真计算,得出了不同弹性模量下成型点与探针之间的作用力.进而利用原子力显微镜接触模式,选用无针尖探针,测量了成型点的力学性能,得出了相同位移载荷下成型点与探针之间的作用力.将测量结果和仿真结果进行比较,推算出成型点的弹性模量.分析结果表明,双光子固化成型点的弹性模量大约为宏观材料弹性模量的1/7.这为进一步研究双光子飞秒激光加工微器件的力学性能提供了基础.

Si(110) surface was modified by wet chemical etching to get regular circular and triangular texture. Then the pull-off force and stick-slip resistant performance of the smooth silicon surface and the modified silicon surface were investigated by a home-made micro-tribotester in the situations of micro load and various relative humidity levels. The results show that the modified surface can decrease the pull-off force caused by the capillary force, and also avoid the stick-slip phenomenon occurring on the smooth...

Si(110) surface was modified by wet chemical etching to get regular circular and triangular texture. Then the pull-off force and stick-slip resistant performance of the smooth silicon surface and the modified silicon surface were investigated by a home-made micro-tribotester in the situations of micro load and various relative humidity levels. The results show that the modified surface can decrease the pull-off force caused by the capillary force, and also avoid the stick-slip phenomenon occurring on the smooth silicon surface when the relative humidity is over 700/0. A model based on the forming and breaking mechanism of liquid bridges was proposed to explain the principle of pull-off force and stick-slip phenomenon on bare and modified surface under environmental humidity. The model can be used to design patterns to control the capillary pull-off force and stick-slip phenomenon.

首先采用湿法刻蚀处理硅110面,得到按一定规律排列的圆形、三角形凹坑修饰硅表面;然后在自行开发的微摩擦黏着实验机上,对光滑硅表面和凹坑修饰硅表面在湿度环境下的黏着和摩擦性能进行了测试,发现经过规则形貌修饰的硅表面可以明显地降低由于毛细作用引起的黏着.摩擦力测试中光滑硅表面在湿度超过700/0后有明显的黏滑现象,而经过修饰的硅表面对黏滑有抑制作用.在此基础上,从硅表面液桥形成及断裂的角度探讨了环境湿度对黏着与黏滑的作用机理,建立了球面接触模式下不同湿度下的黏着力(pull-offforce)与黏滑峰值力的计算模型与公式,并结合实验结果进一步改善了计算模型,可为控制硅表面的毛细黏着与黏滑提供模型依据.

 
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