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端口测试
相关语句
  port-measurement
     The Port-Measurement and Fault Diagnosis of Sealed Systems
     封闭系统的端口测试及故障诊断
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  “端口测试”译为未确定词的双语例句
     The paper mainly discusses dynamic detection technology and implementation scheme of TMS34010 and the related DRAM,VRAM memory and dynamic detection method to implement the corresponding IC,prefers a set of detection system scheme,emphatically describes several key technologies such as ISA equipment dynamic poweron technology,TMS34010 test technology and VRAM serial output termianal test,etc. during engineering process,fulfills the complete dynamic detection system.
     主要讨论了TM S34010及相关DRAM、VRAM存储器的动态检测技术及实现方案,同时讨论了实现对应集成电路动态检测方法,提出了一套检测系统方案,重点描述了工程化过程中ISA设备动态上电技术、TM S34010的测试技术及VRAM串行输出端口测试等几个关键技术,完成了完整的动态检测系统。
短句来源
     Implementing of userport testing of access network based on V5 interface
     基于V5接口的接入网用户端口测试的一种实现方法
短句来源
     The work presented in this dissertation is dedicated to TTCN-3 translation techniques for TPT, which translates the test control data in TTCN-3 to executable codes.
     本论文反映的工作是该项目的子系统“双端口测试系统”(TPT—Two Port Tester)中的“测试支撑工具研究”,即如何将用TTCN-3语言描述的测试控制数据转变为测试系统中的可执行测试数据。
短句来源
     At least three known standards are normally required for the full two-port test fixture calibration in vector network analyzers (VNA).
     一般矢量网络分析仪(VNA)的双端口测试夹具校准,至少需要三个已知标准才能实现.
短句来源
     This paper explains the necessity of userport testing of access network, and analyses the ex- isting problem of 112 user testing.
     说明了接入网用户端口测试功能的必要性,分析了接入网用户112集中测试存在的问题。
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  相似匹配句对
     Test
     测试
短句来源
     The Port-Measurement and Fault Diagnosis of Sealed Systems
     封闭系统的端口测试及故障诊断
短句来源
     Test Algorithm for Register File Memories
     单向双端口SRAM的测试算法
短句来源
     VALUE-ADDED TESTING
     增值测试
短句来源
     THE SETTING AND APPLICATION OF THE COMPUTER PORTS
     端口的设置和利用
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Six-port measurement system, a new measuring instrument for microwave network,has been developed in recent years. Here, the optimum design criterion for six-portcircuit with imperfect power meters is developed by means of computer optimizationand numerical analysis. The criterion agrees with the empirical design criterion prop-osed by Engen in 1977.

端口测试系统是近年来发展的一种新的微波网络测量装置。本文用优化法通过电子计算机数值分析给出了功率计有误差时六端口电路的最佳设计准则。这个准则与ENGEN在1977年提出的经验准则一致。

The port-measurement together with the computer aided faultanalysis will exhibit its great powers of importance for the fault diagnosis ofsealed systems such as the forbidden organs or the integrated circuits sincethe traditional signal tracing method is no longer practicable in these cases.There are two kinds of diagnosis equations, the linear and the nonlinear.The former is formulated under the assumption that the actual value of thenon-faulty components is just equal to its nominal value. Really they are...

The port-measurement together with the computer aided faultanalysis will exhibit its great powers of importance for the fault diagnosis ofsealed systems such as the forbidden organs or the integrated circuits sincethe traditional signal tracing method is no longer practicable in these cases.There are two kinds of diagnosis equations, the linear and the nonlinear.The former is formulated under the assumption that the actual value of thenon-faulty components is just equal to its nominal value. Really they are notnecessarily equal. Thus the solution of the equation may be even incredible.The latter is formulated without the above assumption. It is still possibleto obtain its solution with advanced algorithm and high quality computers thou-gh much complicated. The paper states the advantages and disadvantages of these two kinds ofdiagnosis equations through the description of they algorithms to which theauthor has devoted some new ideas.

对于封闭系统,例如无法进入其内部的禁锁装置,具体如集成电路等,端口测试将显得越发重要。因为在这种场合下,人们不得不放弃以往用讯号逐点迹寻故障的办法而代之以端口测试并用计算机辅助进行诊断。有两类诊断方程:一类是线性诊断方程,一类是非线性诊断方程。前者是在假定非故障组件的实际值与其标称值完全相同的前提下导得的。正因为作了这一假定,求解这类方程比较简单,但其诊断效果往往不佳。后一类方程的导得则未作上述假定,因此所得是一组高阶非线性方程,其求解比较困难,需用高精度的算法和质量较高的计算机。本文将说明这两类诊断方程的利弊及作者研究成果[9~12]。

A detail discussion on multistate technique and a comparison of it with the multi-port technique are given. The relation between output powers and reflection of the device under test is shown. An experjmental millimeter-wave multistate reflectometer is given and its measuring nesults are satisfactory.

本文讨论了多状态测试技术,并将它与多端口测试技术进行了比较,通过分析给出了多状态测试时的功率关系。最后给出了一个工作在毫米波波段的多状态反射计实例,所得结果是令人满意的。

 
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