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x-射线小角反射
相关语句
  相似匹配句对
     Data Processing Techniques of Small-angle X-ray Scattering
     小角X射线散射的数据处理
短句来源
     Research progress in small angle X-ray scattering
     小角X射线散射的研究进展
     The precipitation process causes orientated reflection and scatteringof laser and small angle scattering and two-dimensinal diffraction of X-ray.
     脱溶相引起激光的方向性散射和反射X射线小角散射和二维衍射。
短句来源
     Review on Highly Reflecting Mirrors for Vacuum Ultraviolet and X-ray
     真空紫外~X射线反射膜研究现状
短句来源
     The Latest Advance of Small-angle X-ray Scattering Technique
     小角X射线散射技术的新进展
短句来源
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The Changes of compositions and microstructures of GaAs/AlAS/GaAs trilayers before and after oxidation were investigated. GaAs/Al 2O 3/GaAs thin film was obtained from GaAs/AlAs/GaAs by lateral oxidation and its microstructures were investigated by use of X-ray small angle reflectivity and high angle diffraction. The results show that before oxidation there exists an even transition layer with the thickness of 110 between the AlAs layer and the upper GaAs layer. The AlAs layer was separated into two layers,...

The Changes of compositions and microstructures of GaAs/AlAS/GaAs trilayers before and after oxidation were investigated. GaAs/Al 2O 3/GaAs thin film was obtained from GaAs/AlAs/GaAs by lateral oxidation and its microstructures were investigated by use of X-ray small angle reflectivity and high angle diffraction. The results show that before oxidation there exists an even transition layer with the thickness of 110 between the AlAs layer and the upper GaAs layer. The AlAs layer was separated into two layers, one is of 40 thickness and the other 1050. The average atomic density of the thin AlAs layer is less than that of the thick AlAs layer. After lateral oxidation, AlAs was oxidized into Al 2O 3, and the thickness and roughness of the transition layer metioned above decrease.

研究了GaAs/AlAs/GaAs三层膜氧化前后成分和微结构的变化。对GaAs/AlAs/GaAs利用横向氧化的方式得到了GaAs/Al2 O3/GaAs薄膜 ,利用X射线小角反射和高角衍射技术进行了微结构表征。结果表明 ,氧化前GaAs/AlAs/GaAs结构中 ,AlAs层与表面GaAs之间存在着一层110 的均匀过渡层。AlAs层分成厚度为 4 0 和 10 5 0 的两层 ,而 4 0 厚的AlAs层的平均原子密度比 10 5 0 厚的减小。利用横向氧化的方式使得AlAs完全氧化为Al2 O3,而且与氧化前相比 ,其过渡层的厚度与粗糙度均减小。

The X-ray reflectivity of Zr -Cu metallic multiplayer film at low-angle was mea sured by using a high-resolution triple-axis X-ray diffractometer.In terms of the expanded Born-Wolf optical model,the X-ray reflectivity data at low-angle were quantitatively analysed.Re sults in-dicated that the Zr (40nm)/Cu(40nm) 75 metallic multiplayer film with equal layer thick ness shows an artificially superlattice structure along the growth direction.Because of in terdiffus-sion there exist the interface micing layers,which...

The X-ray reflectivity of Zr -Cu metallic multiplayer film at low-angle was mea sured by using a high-resolution triple-axis X-ray diffractometer.In terms of the expanded Born-Wolf optical model,the X-ray reflectivity data at low-angle were quantitatively analysed.Re sults in-dicated that the Zr (40nm)/Cu(40nm) 75 metallic multiplayer film with equal layer thick ness shows an artificially superlattice structure along the growth direction.Because of in terdiffus-sion there exist the interface micing layers,which reduce the high-order Bragg peak inten sities of the X-ray reflectivity at low-angle.The misfit of lattice constants between the two metals makes the high-order Bragg peaks broad.

用高分辨的三晶体X-射线衍射仪测量了Zr、Cu金属交替的多层膜的X-射线小角反射谱。用扩展了的Born-Wolf光学模型对Zr、Cu多层膜的X-射线小角反射数据进行了定量分析。结果表明,该金属多层膜在其生长方向具有超晶格结构。在两层金属膜之间的界面上,由于内扩散,形成了界面交混层,它使X-射线小角反射所产生的高阶Bragg峰的强度减弱。由于两种金属膜的晶格不匹配,使高阶Bragg峰加宽。界面的粗糙度可用来模拟X-射线小角反射曲线的阻尼振荡效应。

 
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