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   半导体噪声 的翻译结果: 查询用时:0.415秒
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半导体噪声
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  “半导体噪声”译为未确定词的双语例句
     The method and system for measuring parametros of fL and γ of 1/f noise in BJT are presented.
     晶体管低频噪声主要是1/f噪声,其参数f_L和r的测出,不仅对低频低噪声设计,而且对于研究半导体噪声机理以及应用它来分析半导体内部缺陷或表面清洁处理情况都有着重要意义。
短句来源
     Therefore a noise-measurement system for semiconductors based on virtual instrument was established.
     为此,组建了一套基于虚拟仪器的半导体噪声测试系统.
短句来源
  相似匹配句对
     Noise of semiconductor laser arrays
     列阵半导体激光器的噪声
短句来源
     Electrical Noise in Semiconductor Lasers
     半导体激光器的电噪声
短句来源
     Semiconductor Solar Cells
     半导体太阳电池
短句来源
     Semiconductor ceramic capacitors.
     半导体陶瓷电容器
短句来源
     and noise group (N. G.)
     和噪声组(N.G.)
短句来源
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  noise of semiconductor
A technique and laboratory setup for measuring the low-frequency current noise of semiconductor gas-sensitive structures in a spectral range of 0.001-100 Hz are described.
      
The measurement of the noise of semiconductor instruments in the range of infrasonic frequencies is of great scientific and practical interest.
      
Apparatus for measuring the frequency exponent of the spectrum of excess noise of semiconductor devices
      
Intrinsic noise of semiconductor lasers in optical communication systems
      
Noise of semiconductor gas sensors in response to a sharp change in the composition of the gaseous phase
      
  semiconductor noise
A formula is derived that linearly relates this duration to the signal from the antenna, in which the noise temperatures of the semiconductor noise generator and the matched load act as two reference values.
      


The method and system for measuring parametros of fL and γ of 1/f noise in BJT are presented. Finally, the examples are given.

晶体管低频噪声主要是1/f噪声,其参数f_L和r的测出,不仅对低频低噪声设计,而且对于研究半导体噪声机理以及应用它来分析半导体内部缺陷或表面清洁处理情况都有着重要意义。本文给出了双极晶体管的1/f噪声参数的测量方法、系统及实例,获得了已有噪声测量系统所不能给出的参数。

The noise components estimation of semiconductors is the precondition of reliability screening of semiconductor devices using noise measurement. Therefore a noise-measurement system for semiconductors based on virtual instrument was established. On the base of measuring a great deal of optoelectronic coupled devices (OCDs), which is very useful in many areas, a novel method that can estimate the noise components by PSD of the noise and carry though noise parameters fitting using LabVIEW was proposed....

The noise components estimation of semiconductors is the precondition of reliability screening of semiconductor devices using noise measurement. Therefore a noise-measurement system for semiconductors based on virtual instrument was established. On the base of measuring a great deal of optoelectronic coupled devices (OCDs), which is very useful in many areas, a novel method that can estimate the noise components by PSD of the noise and carry though noise parameters fitting using LabVIEW was proposed. It is the characteristic that we can use the measurement without prior knowledge low frequency noise about semiconductors, which provides the probability to improve production techniques and reliability of OCD and other semiconductor devices.

 半导体的噪声成分估计是利用噪声进行器件可靠性筛选的前提条件.为此,组建了一套基于虚拟仪器的半导体噪声测试系统.在应用该系统对大量的光电耦合器件(OCD)进行测试基础上,提出了采用LabVIEW对实测噪声功率谱进行噪声成分估计及参数拟合的新方法.该方法的特点是不需要被测器件低频噪声的先验知识,为改进OCD及其他半导体器件的生产工艺和提高器件的可靠性提供了指导性的数据.

 
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