The laser plasmam soft X-ray spectra with wavelength up to 5. 8 nm have been taken by using OHM crystal (2d= 6. 35 nm), combining with very thin carbon filter (310 nm in thickness) and soft X-raysensitive film (SIOFM-5FW).
The soft X-ray spectra of Na-like Ge ion of ls22s22p6nl(n=3-6,l=0 -5) configurations for dipole-allowed transitions are computed with the aid of the HFR program with the optimization of Slater paramters on the basis of the known experimental levels.
Soft X-ray spectra of iron plasma produced by nano-second laser in the 5～27nm range was measured using the McPHERSON model 247 monochrometer in high vacuum, with a monochrometer resolution of Δλ≤0.075nm and a wavelength scanning interval of 0.1nm. Certain strong emission lines were identified.
With the aid of extraction complex of C thin film,TEM and energy dispersion X-ray spectrum(EDX),the dissolve rule of Nb,V and Ti in Nb-V-Ti and V-Ti microalloyed steel was studied by isothermal holding at different temperatures and for different time.
Quantitative analysis of the x-ray spectrum in the keV range is often used to derive diagnostic information on electron temperature, density, ionization states, and expansion velocity of the plasma as well as its spectral characterization for various applications.
Through analysing X-ray spectrum of plasma in differental condition of laser po-(To be continued on page 214) (Continued from page 278) wer, we have found that Cu plasma radiate much x-ray lines, in which the line 2S~22 p~6-2S~22P~53D for Ne-like is strongest and space occupied by above ions is the largest.
tube oven method,X-ray spectrometry method and chemiluminescence sulfur method is performed. Test results show that each method has its own determination principle,merit and shortcoming,as well as applicable fields. To determine the sulfur content in lubricating oils and additives at lab can choose the suitable method according to the experiment conditions and sample properties.
It includes: the X ray fluorescence (XRF) laboratories in China, the related XRS techniques and analytical methods of XRF, the applications and achievements, the publications and academic exchanges, the personnel training, the coordinations of X ray spectrometry with the other analytical techniques, the demands of present geoanalysis for XRS and the future development of XRS.
The prepared CdSe NCs were characterized by ultraviolet-visible spectra (UV-Vis), photoluminescence (PL), transmission electron micrograph (TEM), energy disperse X-ray spectra (EDX) and X-ray diffraction (XRD).
Rising the signal-to-noise ratio in X-ray spectra of femtosecond laser-produced plasmas using the "mean-median" algorithm
In turn, the noise signals of X-ray detectors grow in amplitude and the signal-to-noise ratio in recording X-ray spectra of multiply charged ions approaches unity.
The most powerful effect of the above factors is exerted on X-ray spectra recorded by such electromagnetic equipment as CCD-based detectors, photoelectron amplifiers, etc.
A new "mean-median" algorithm is described, with which it is possible to considerably increase the signal-to-noise ratio of CCD detectors used to measure X-ray spectra of femtosecond laser-produced plasma.
It was found that, during implosion of double multiwire arrays, more than 90% of the total energy corresponding to the soft X-ray spectrum were emitted from an area >amp;lt;500 μm in diameter.
The relative integral intensity of the last emission line in the characteristic X-ray spectrum is used as the first analytical signal.
The spectral intensity of the brightest (Kα, Lαand, less frequently, Mαor Mβ) lines of the characteristic X-ray spectrum serves as the second analytical signal, which is conventionally used in X-ray fluorescence analysis.
The ratios of the intensities in the X-ray spectrum were measured: , , , and .
The brightness distribution and X-ray spectrum of the SNR are obtained from archival ROSAT and ASCA X-ray data.
The consideration of the classical physical fundamentals of X-ray spectrometry suggests that the properties of X-ray spectra of elements are determined by their atomic number rather than atomic weight.
The crystal perfection of the layers is estimated by highresolution x-ray spectrometry.
The parameters of deep-level trapping centers are determined by the method of the thermostimulated capacitor discharge; the degree of perfection of the film and substrate are determined by the two-crystal X-ray spectrometry method.
The microstructure and phase of BaPbO3 thin films were determined by X-ray diffractometry, scanning electrons microscopy and energy dispersive X-ray spectrometry.
For the sample preparation of many ferroalloys in connection with their analysis by optical emission or X-ray spectrometry the recasting process has been approved.