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   薄膜厚度 的翻译结果: 查询用时:1.69秒
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薄膜厚度     
相关语句
  film thickness
     EFFECT OF YBa_2Cu_3O_(7-δ) FILM THICKNESS ON THE DIELECTRIC PROPERTIES OF Ba_(0.1)Sr_(0.9)TiO_3 IN Ag/Ba_(0.1)Sr_(0.9)TiO_3/YBa_2Cu_3O_(7-δ)/LaAlO_3 MULTILAYER STRUCTURES
     YBa_2Cu_3O_(7-δ)薄膜厚度在多层异质结构(Ag/Ba_(0.1)Sr_(0.9)TiO_3/YBa_2Cu_3O_(7-δ)/LaAlO_3)中对Ba_(0.1)Sr_(0.9)TiO_3介电性能的影响研究
短句来源
     Effect of film thickness on the magnetic domain of Co_(60)Fe_(20)B_(20) films by MFM
     利用MFM研究薄膜厚度对Co_(60)Fe_(20)B_(20)薄膜磁畴结构的影响
短句来源
     When the film thickness increased from 125 nm to 488 nm,the stress decreased from 392 MPa to 30 MPa.
     随着薄膜厚度的增加,TiO2薄膜应力逐渐减小,从125 nm的392 MPa下降到488 nm的30 MPa;
短句来源
     The stability of ZnO/Ag/ZnO thin films is improved with the increase of upper ZnO thin film thickness.
     随着顶层ZnO薄膜厚度的增加,ZnO/Ag/ZnO薄膜的稳定性提高。
短句来源
     Influences of the Film Thickness on Residual Stress of the HfO_2 Thin Films
     薄膜厚度对HfO_2薄膜残余应力的影响
短句来源
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  thin film thickness
     The stability of ZnO/Ag/ZnO thin films is improved with the increase of upper ZnO thin film thickness.
     随着顶层ZnO薄膜厚度的增加,ZnO/Ag/ZnO薄膜的稳定性提高。
短句来源
     By analyzing microstructure, orientation and surface roughness, optimum processing parameters are gained as following:Substrate temperature ranging from 700 to 750℃, sputtering power ranging from 100 to 150(×2)w, sputtering pressure being 14Pa, Po2:PAr being about 1:2, CeO2 thin film thickness ranging from 10 to 40Pa.
     通过对所制备CeO_2 薄膜微观结构、表面形貌分析,得到生长CeO_2 薄膜所需要的最优工艺参数为:基片温度为700~750℃,溅射功率为100~150(×2)W,溅射气氛为14Pa,氧氩比为1:2,CeO_2薄膜厚度为10~40nm。
短句来源
     The influence of the Sb thin film thickness on the readout signal was investigated, the results showed that the optimum Sb thin film thickness is 28~30 nm, and the maximum signal-noise ratio is 38~40 dB.
     同时研究了Sb薄膜厚度对读出信噪比的影响规律 ,发现最佳的Sb薄膜厚度为 2 8~ 30nm ,所得的信噪比为 38~ 40dB。
短句来源
     Half-wave Loss and Thin Film Thickness in the Thin Film Interference
     薄膜干涉中的半波损失与薄膜厚度
短句来源
     This paper analyzed errors of measurement of thin film thickness by 6JA interfero microscope,gave corrective coefficient and experiment results.
     分析了国产6JA型干涉显微镜测量薄膜厚度所产生的误差,给出了修正系数及实验结果
短句来源
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  thickness of film
     The film and substrate combine firmly,the thickness of film is about 1.0 μm.
     薄膜与衬底的结合紧密,薄膜厚度均匀,膜厚约为1.0μm。
短句来源
     In this paper, by analyzing the relations between the thickness of film and the ratiosof X-ray diffraction intensity from each component of the composite polycrystalline thinfilms of Cu/Ag,Ag/Al and Al/Cu, it is shown that there is a linear relationship betweenthe thickness and the intensity ratios.
     通过对Cu/Ag、Ag/Al和Al/Cu复合多晶薄膜各组分之间的X射线衍射强度之比与已知薄膜厚度之比的分析,得出了衍射强度与薄膜厚度之间存在着近似的线性关系。
短句来源
     Based on the theory of X-ray diffraction and absorption, a method for measuring the thickness of film material according to the diffraction intensity of the matrix below film was established.
     基于X射线衍射与吸收理论,提出一种薄膜厚度测量方法即膜下基体衍射法。
短句来源
     The results show that the film on the boron particles is well distributed and compact and the thickness of film is about 25 nm.
     结果表明,硼粉颗粒表面包覆了均匀且致密的L iF薄膜,薄膜厚度25 nm。
短句来源
     In the paper, polyethylene is used for the resin matrix of thermal infraredcamouflage coating and the effects of type, pigment, antioxidant, thickness of film on the emissivity are deeply analyzed. The mechanics performance, fluidity, aging are pilot studied.
     本论文选择聚乙烯为热红外伪装材料的树脂基体,对树脂基体种类、颜料、抗老化助剂、薄膜厚度、基材等因素对发射率的影响进行了较为深入地分析研究,并对所制备的低发射率聚乙烯材料的力学性能、流动性能、老化性能进行了初步研究。
短句来源
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  thin-film thickness
     Correction of the estimate function in thin-film thickness wideband monitoring
     薄膜厚度宽带监控中评价函数的修正
短句来源
     The Monitoring Control of Optical Thin-film Thickness
     光学薄膜厚度实时监控系统检测电路设计
短句来源
     In the optoelectronic detection of thin-film thickness monitoring control system, based on the characteristics of quar-optical path, an idea of dual-lock-phase detection to faint signal is proposed, the multi-stage amplifier and the dual-lock-phase amplifier are developed.
     在薄膜厚度监控系统的光电检测中 ,针对信号特征 ,提出了微弱信号的双锁相检测思想 ,并研制了一套多级放大器和双锁相放大器 .
短句来源
     Integrating the modified variance analysis,uncertainty analysis,standard deviation and relative deviation with linear regression analysis,the stability in monitoring thin-film thickness are evaluated with six indexes showing different requirements. In addition,the control precision of thin-film thickness and variation of characteristic wavelength are analyzed.
     将修正的方差分析方法、不确定度分析方法、标准偏差与相对偏差方法和线性回归方法等综合起来,用6项指标从各个方面对光学薄膜厚度监控的稳定性做出评判,甚至对膜厚控制精度和特征波长做出分析。
短句来源

 

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  film thickness
Surface roughness shows an obvious effect on load capacity when it is greater than one-tenth of the film thickness, and the surface with longitudinal pattern affects the load capacity most.
      
The dependence of the effective dielectric constant on the temperature and the average spontaneous polarization on the film thickness are computed, which qualitatively agree with the experiments.
      
The difference in the interface energy of different compartments of the pattern should increase with increasing film thickness.
      
Microinterferometric methods of assessment of foam and wetting films are used which allow precise determination of the film thickness.
      
At small time intervals, the film thickness was determined according to the Landau-Levich-Derjaguin method.
      
更多          
  thin film thickness
Experimental results on measurements of thin film thickness are presented.
      
On the other hand, the enthalpy change approaches that of the bulk value as the thin film thickness increases just beyond the low nanometer regime.
      
At the same time, at micron or sub-micron scale, another effect, which is referred to as the geometrical size effects such as crystal grain size effect, thin film thickness effect, etc., also influences the measured material hardness.
      
The dependence of the relative intensityk on the thin film thickness has been measured.
      
A data processing method is presented making it possible to determine thin film thickness from GDOS depth profiles.
      
更多          
  thickness of film
The thickness of film was measured to be approximately 30?±?10?nm.
      
In our result we can choose proper parameter in order to let the thickness of film tend to zero and have it approach the surface of horizon.
      
The technical solutions for controlling the thickness of film and fibre materials when the object measured exhibits transverse mechanical oscillations are reported.
      
Then via the improved brick-wall method, membrane model, we obtain that we can choose proper parameter in order to let the thickness of film tend to zero and have it approach the surface of its horizon.
      
Effect of thickness of film of fuel on the rate of heterogeneous (gas-film) detonation
      
更多          
  thin-film thickness
The results show that there is a significant enhancement on the pressure field in the presence of viscoelasticity when the minimum thin-film thickness is sufficiently small.
      
Electron probe microanalysis (EPMA) measurement of thin-film thickness in the nanometre range
      
In particular, this approach improves substantially the thin-film thickness measurements and analysis accuracy.
      
In the second configuration one of the mirrors is replaced by SiO2 thin film on the silicon wafer and the recorded channelled spectrum is fitted to the theoretical one to determine the thin-film thickness.
      
We determine the thin-film thickness for four samples provided that the optical constants for all the materials involved in the experiment are known.
      
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