助手标题  
全文文献 工具书 数字 学术定义 翻译助手 学术趋势 更多
查询帮助
意见反馈
   black方程 的翻译结果: 查询用时:0.33秒
图标索引 在分类学科中查询
所有学科
自动化技术
更多类别查询

图标索引 历史查询
 

black方程
相关语句
  black ' s equation
     ADALine based model to solve Black's equation is proposed and the Back Propagation (BP) models is adopted to predict median time to failure of the failure distribution.
     本文用ADALine模型来解Black方程并用背传模型预测了中值失效时间 .
短句来源
     Additional variables such as line width that can not be reflected in the Black's equation are used in this BP model.
     其它没有包括在Black方程中的参数例如线的宽度也都用在了背传模型中 .
短句来源
  “black方程”译为未确定词的双语例句
     The Study of Current Density Exponent and AccurateMeasurement Technology in Black Equation
     Black方程中电流密度因子及精确测量技术的研究
短句来源
     The n of four samples have been measured,the results proved the values of n are dependent on materials and agree well with the BLACK equation.
     测试了4种不同样品。 结果表明,n值与材料有关,并符合BLACK方程
短句来源
     It has been shown that there exist some pitfalls in the accelerated lifetime test, such as different atom diffusion mechanism under high stress condition and for normal operations, limited applications of BLACK equation, effects of special test structure on test results and variation of temperature coefficient of resistors(TCR).
     分析表明,加速寿命试验方法存在高应力条件与正常工作条件下互连线电迁移中金属离子扩散机制不同、BLACK方程的使用范围有限、受试件特殊结构影响和电阻温度系数TCR随温度变化等问题。
短句来源
  相似匹配句对
     Black, M.Scholes and R.
     Black,M.
短句来源
     Black,M.
     Black,M.
短句来源
     JACOBI RATIONAL SPECTRAL METHOD FOR BLACK-SCHOLES-TYPE EQUATION
     Black-Scholes方程的Jacobi有理谱方法
短句来源
     THE EQUATION OF MAGNETIC LINE OF FORCE
     磁力线方程
短句来源
     The simple equation changes into nonlin-ear Schrodinger equation when viscous effect is died away.
     dinger 方程
短句来源
查询“black方程”译词为用户自定义的双语例句

    我想查看译文中含有:的双语例句
例句
为了更好的帮助您理解掌握查询词或其译词在地道英语中的实际用法,我们为您准备了出自英文原文的大量英语例句,供您参考。
  black ' s equation
The volumetrically averaged current density and the maximum temperature in a solder bump are integrated into Black's equation to calibrate the experimental electromigration fatigue lives.
      
Black's equation is widely used in thermal reliability analysis and design.
      
For EM subject to spatial thermal distribution, Black's equation cannot be applied directly.
      
Therefore, the commonly used Black's equation is still applicable by using our constant reliability equivalent temperatures.
      


The measurement of current density exponent (n) is an extremely important parameter used for evaluating the lifetime of metallization in microelectronic devices. A new dynamic current-ramp method was developed to test the exponent n. It improved the accuracy and reduced test time by one or two orders of magnitude, comparing with the MTF method. The n four samples were measured under continuous DC, they were 2.29 (Al-Si alloy), 1.25 (Al-Si-Cu alloy), 1.28 (Al-Si/Ti two-level metallization) and 1.23 (Al-Si/TiWTi/AI-Si...

The measurement of current density exponent (n) is an extremely important parameter used for evaluating the lifetime of metallization in microelectronic devices. A new dynamic current-ramp method was developed to test the exponent n. It improved the accuracy and reduced test time by one or two orders of magnitude, comparing with the MTF method. The n four samples were measured under continuous DC, they were 2.29 (Al-Si alloy), 1.25 (Al-Si-Cu alloy), 1.28 (Al-Si/Ti two-level metallization) and 1.23 (Al-Si/TiWTi/AI-Si multilevel ), respectively. These results proved that the values of n are dependent on materials and well agreed with that of the black equation. The exponent n was also studied under different test temperature and current-ramping slope.It is independent of temperatureand current-ramping slope in a wide range.

采用电流斜坡法测试了4种不同金属化样品,其n值分别为:2.29(Al-Si合金膜),1.25(Al-Si-Cu合金膜),1.28(Al-Si/Ti双层金属化),1.23(Al/TiWTi/Al多层金属化).结果表明,n值与材料有关,电迁徙阻力越高n值越小,与BLACK方程相符。同时,考察了不同温度和不同电流上升斜率对n值测量结果的影响,试验表明,在相当宽的温度范围和测试时间内获得的n值一致性很好。

In this paper,a new dynamic current ramp method is different from the conventional MTF developed for testing the exponent n.The n of four samples have been measured,the results proved the values of n are dependent on materials and agree well with the BLACK equation.

介绍了一种与传统MTF法完全不同的测量电流密度因子n的新型动态电流斜坡测试法。测试了4种不同样品。结果表明,n值与材料有关,并符合BLACK方程

ADALine based model to solve Black's equation is proposed and the Back Propagation (BP) models is adopted to predict median time to failure of the failure distribution. Additional variables such as line width that can not be reflected in the Black's equation are used in this BP model. Results demonstrate that the neural network is one of the powerful tools for study on the properties of electromigration in metal alloys.

本文用ADALine模型来解Black方程并用背传模型预测了中值失效时间 .其它没有包括在Black方程中的参数例如线的宽度也都用在了背传模型中 .本文给出的结果显示人工神经网络是研究金属合金中电迁移特性的非常强有力的手段之一 .

 
<< 更多相关文摘    
图标索引 相关查询

 


 
CNKI小工具
在英文学术搜索中查有关black方程的内容
在知识搜索中查有关black方程的内容
在数字搜索中查有关black方程的内容
在概念知识元中查有关black方程的内容
在学术趋势中查有关black方程的内容
 
 

CNKI主页设CNKI翻译助手为主页 | 收藏CNKI翻译助手 | 广告服务 | 英文学术搜索
版权图标  2008 CNKI-中国知网
京ICP证040431号 互联网出版许可证 新出网证(京)字008号
北京市公安局海淀分局 备案号:110 1081725
版权图标 2008中国知网(cnki) 中国学术期刊(光盘版)电子杂志社