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mapping技术
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  mapping technique
     The defects distribution of SI-GaAs wafer using PL Mapping technique
     PL Mapping技术检测大直径SI-GaAs晶片中缺陷分布
短句来源
     In this paper,the defects distribution of SI-GaAs wafer was studied using PL Mapping technique in detail.
     采用PL Mapping技术,检测6英寸SI-GaAs晶片的均匀性,从而得到样品中的缺陷分布状况。
短句来源
     Mapping Technique for Resistivity Distribution Measurement on Cross-Section of Original Silicon Monocrystal Using Inclined-Placed Square-Probe
     斜置式方形探针测量单晶断面电阻率分布mapping技术
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     Measurement Mapping technique of sheet resistance for microareas using microprocessor
     微处理器在微区薄层电阻测试Mapping技术中的应用
短句来源
     Measurement Mapping Technique of Sheet Resistance for Microarea Using Microprocessor
     微处理器在微区薄层电阻测试Mapping技术中的应用
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  “mapping技术”译为未确定词的双语例句
     Mapping Technigue for Measurement of Sheet Resistance Distribution
     薄层电阻测试Mapping技术
短句来源
     The Research on and Realization of Bump Mapping
     Bump Mapping技术的研究与实现
短句来源
     ASSC frame has adopted DHtml page to develop technology, JavaScript programming technology , J2EE WEB programming technology , O/R Mapping technology , relation type data base administration and application technology ,etc, have used the tree component of Jenkov, XLoadTree component of WebFX, Sitemesh application program interface frame that OpenSymphony organizes, DOM4J Xml that Apache organizes uses software package, Hibernate O/R Mapping frame ,etc. increase income software development frame, application program component and application program wrap up .
     ASSC框架采用了DHtml页面开发技术、JavaScript编程技术、J2EE WEB编程技术、O/R Mapping技术、关系型数据库管理和应用技术等,应用了Jenkov树构件、WebFX的XLoadTree构件、OpenSymphony组织的Sitemesh应用程序界面框架、Apache组织的DOM4J Xml应用软件包、Hibernate O/R Mapping框架等开源软件开发框架、应用程序构件和应用程序包。
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     The implemented SSM function based on IGMPv3 and PIM-SSM has great practical value, and can be widely used in market.
     本文所实现的基于IGMPv3和PIM-SSM协议的源特定组播以及SSM-Mapping技术具有广阔的市场应用前景,具有一定的理论意义和实用价值。
短句来源
     On the other hand,we proved the relationship between AB microdefects and MESFET devices performance via PL mapping method.
     另外,试验还利用PL mapping技术从另一个角度检验了衬底质量和MESFET器件电性能的关系。
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  相似匹配句对
     TECHNOLOGY
     技术
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     Technology;
     技术
短句来源
     Mapping Technigue for Measurement of Sheet Resistance Distribution
     薄层电阻测试Mapping技术
短句来源
     The Research on and Realization of Bump Mapping
     Bump Mapping技术的研究与实现
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  mapping technique
The structure of FP was confirmed by the peptide mapping technique, and the leader fragment was shown to contain noN-terminal Met residue.
      
The estimated BH masses Mx are compared with the masses Mrev determined by the reverberation mapping technique.
      
Radiation hybrid (RH) mapping technique was exploited to determine chromosome locations of 26 human novel full length cDNAs recently cloned.
      
The mapping technique is focused for the first time on applying regularly gridded data in this review.
      
Background: Magnetocardiography (MCG) is a non-contact mapping technique to record cardiac action currents.
      
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The microarea probe technique of a modified Van der pauw method is used for measuring the sheet resistance for the boron-doped microareas on an n-type silicon wafer.Its distribution is shown with the grey scale. From it, the variation of sheet resistance and the average value on the wafer can be obtained. The mapping technique seems to be more suitable to assess the material quality.

利用改进的范德堡法微区薄层电阻测试探针技术对n-Si片上的硼扩散图形进行薄层电阻的测量,并用发度表示其分布,可得到薄层电阻的不均匀度及平均值.这种所谓Mapping技术更有利于评价材料质量.

A new microarea inclined four - probe technique was used for measuring the sheet resistance for boron diffusion doped microareas on a n-type silion wafer. Its distribution is shown with the grey scale. This mapping techique seems to be more suitable to asses the material quality. In the measurement process, We abopted a microprocessor to pick up the measured Voltages and to show the digital values of then respectively, finaIly to turn into the digital sheet resistance. Thus, that speeds up the calculating processes...

A new microarea inclined four - probe technique was used for measuring the sheet resistance for boron diffusion doped microareas on a n-type silion wafer. Its distribution is shown with the grey scale. This mapping techique seems to be more suitable to asses the material quality. In the measurement process, We abopted a microprocessor to pick up the measured Voltages and to show the digital values of then respectively, finaIly to turn into the digital sheet resistance. Thus, that speeds up the calculating processes and has the advantage of controlling the proper positions of the probes.

本文利用微区薄层电阻测试的一种斜置四探针新方法,将扩散微区薄层电阻测试结果绘成全片的灰度图,这种微区薄层电阻测试Mapping技术十分有利于评价材料的质量。在测试过程中应用微处理器,可立即数字显示相应的测量电压及微区的薄层电阻,加快了计算速度并有利于控制探针的合适位置。

A new microarea inclined four probe technique is used for measuring sheet resistance.Its distribution is shown with the grey scale.This mapping technique is more suitable to assess material quality.In the measurement process,we adopted a microprocessor to pick up the measured voltages and to show the digital values of them respectively,finally to turn into the digital sheet resistance.Thus,that speeds up calculating processes and is advantageous to control the proper positions of the probes.

利用微区薄层电阻测试的一种斜置四探针新方法,将扩散微区薄层电阻测试结果绘成全片的灰度图,这种Mapping技术十分有利于评价材料的质量。在测试过程中应用微处理器,可立即数字显示相应的测量电压及微区的薄层电阻,加快了计算速度并有利于控制探针的合适位置。

 
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