The experiments of n-doped silicon micro-EDM in demonized water have been carried out. The maching speed,the wear of the electrode roughness in demonized water are compared with those in kerosene.
The experimental results show that the maching speed of n-doped silicon micro-EDM in demonized water is higher than in kerosene,and the wear of the electrode is also higher,and roughness is almost the same. Demonized water is a kind of better dielectric fluid.
Based on this, the quantitative relationship between longitudinal and transverse piezoresistance coefficient of N-silicon is derived asMoreover, π12 sing is positive and π11 is engative.
The experimental results show that the ra- diation resistance of the silicon with higher resistivity is higher and that irradiation at large flux can change n-type silicon into p-type.
The TiO2 powder was dispersed in aqueous solutions of poly(3,4-ethylendioxythiophene)/poly(styrenesulfonate) (PEDOT-PSS), and the blends were coated on n-doped silicon substrates to achieve simple design heterojunctions.
Ti(Si(1-x)Ge(x))2 formation on narrow lines was carried out on phosphorous doped material, because of the well known difficulties of forming silicide on heavily n-doped silicon.
According to the experimental results, the effects of original silicon parameters on characteristics of semicondoctor detectors have been discussed. These parameters are: crystallized condition under different atmosphere, homogeneity of resistivity, impurity compensation, carrier lifetime, oxygen content, dislocation and other defects. The radi-ation detectors from various N-type and P-type silicon single crystals of high resisti-vity have been made, and the performance of detectors are compared. The basic ...
We have observed electrical defects in p+ implanted N-type Si. After thermal annealing at the temperature range from 200℃ to 700℃ and Cw-Co2 laser annealing with different radiative time the energy levels, concentration profile and capture cross section of these traps were measured. Possible structures of defects were discussed on the comparison of annealing behaviour of defects with results obtained by other authors.