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x射线出现
相关语句
  x-ray appearance
     ANALYSES OF THE BACKGROUND IN X-RAY APPEARANCE POTENTIAL SPECTRUM
     X射线出现电势谱的本底分析
短句来源
     QUANTUM ANALYSIS OF THE BACKGROUND IN X-RAY APPEARANCE POTENTIAL SPECTRUM
     X射线出现电势谱本底的量子分析
短句来源
     A HIGH-SENSITIVE SOFT X-RAY APPEARANCE POTENTIAL SPECTROMETER WITH A MULTICHANNEL PLATE
     用微通道板的高灵敏软X射线出现电势谱仪
短句来源
     We have discussed the spectrums of 4J-29 Kovar alloy in different technical process and found that the soft X-ray appearance potential spectrometer can be used to detect the process in which the carbon is released on kovar alloy surface.
     通过对4J-29可伐合金不同工艺处理后所测得的软X射线出现电势谱(SXAPS)进行分析对比,找到了利用软X射线出现电势谱作为监控可伐合金脱碳工艺质量的途径。
短句来源
     The Soft X-Ray Appearance Potential Spectrometer Applied in Electro-Vacuum Technology
     软X射线出现电势谱在电真空工艺应用中的探讨
短句来源
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  “x射线出现”译为未确定词的双语例句
     The Characteristic Degassing of Stainless Steel Studied by SXAPS in Vacuum
     使用软X射线出现电势谱仪研究不锈钢真空出气特性
短句来源
     The degassing of stainless steel was investigated in a combined equipment including JWC-1 type UHV made stainless steel, SJX-1 quadrupole mass spectrometer and home-made soft X-ray appearence potential spectrometer.
     木文介绍用国产JWC-1型无油超高真空机组、SJX-1四极分析器和自制软x射线出现电势能谱仪联合装置研究不锈钢的真空出气特性。
短句来源
     A multifunctional core-level electron spectrometer containing theAuger electron spectroscopy (AES),Auger electron appearance potential spectro-scopy (AEAPS),soft x-ray appearance-potentiall spectroscopy (SXAPS) anddisappearance potential spectroscopy(DAPS)for surface analysis was described.
     本文叙述一种包含俄歇电子谱、俄歇电子出现电势谱、软x 射线出现电势谱和消隐电势谱等四种表面分析手段的联合谱仪。
短句来源
  相似匹配句对
     ANALYSES OF THE BACKGROUND IN X-RAY APPEARANCE POTENTIAL SPECTRUM
     X射线出现电势谱的本底分析
短句来源
     QUANTUM ANALYSIS OF THE BACKGROUND IN X-RAY APPEARANCE POTENTIAL SPECTRUM
     X射线出现电势谱本底的量子分析
短句来源
     x-ray spectrometry;
     X射线分析;
短句来源
     ray is homeotype;
     射线为同型;
短句来源
     Progress in X Ray Fluorescence Analysis
     X射线荧光光谱分析
短句来源
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  x-ray appearance
The X-ray appearance of AHS is a more or less homogeneous increase in density with blurred margins, which on scintiscan with labeled phosphate compounds is associated with intense accretion of tracer.
      
Soft x-ray appearance potential spectra from solids carry information on the local density of unoccupied states in the surface region of the sample.
      
Examples are given for soft x-ray appearance potential measurements.
      
Any conventional soft x-ray appearance potential spectrometer may be converted to an isochromat spectrometer by placing an absorber foil of suitably chosen thickness in front of the x-ray detector.
      
Any conventional soft x-ray appearance potential spectrometer may be converted to an isochromat spectrometer by placing an absorber foil of suitably chosen thickness in front of the x-ray detector.
      
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The soft X-ray appearance potential spectroscopy (SXAPS) is a useful technique for surface analysis.The method is based on the fact that as the surface of a solid is bombarding by an electron beam, the soft X-ray fluorescence of this material as a function of the incident electron energy exhibits abrupt changes at the appearance potentials of characteristic X-rays. The main informations contained in these appearance potential peaks are revealing the binding energies of core electrons and about the density of...

The soft X-ray appearance potential spectroscopy (SXAPS) is a useful technique for surface analysis.The method is based on the fact that as the surface of a solid is bombarding by an electron beam, the soft X-ray fluorescence of this material as a function of the incident electron energy exhibits abrupt changes at the appearance potentials of characteristic X-rays. The main informations contained in these appearance potential peaks are revealing the binding energies of core electrons and about the density of unfilled valence states.

x射线出现电势谱仪(APS)是一种表面物理仪器。它利用电子轰击固体表面时所产生的特征x射线来进行固体的表面分析,测定原子芯电子的束缚能和提供空带电子能态出度的有用信息。它不需要用能量分析器来检测出射光电子,而固有分辨率却高于任何芯能级谱仪。已制作的全套出现电势谱仪包括超高真空系统,分析管,锁定放大器和逐级扫描斜坡电压发生器等。文中给出了对金属(镍)、合金(铬镍铁、镍钨钙)、半导体(硅)等各种固体表面的实验结果.

The degassing of stainless steel was investigated in a combined equipment including JWC-1 type UHV made stainless steel, SJX-1 quadrupole mass spectrometer and home-made soft X-ray appearence potential spectrometer. We have succeeded in characterizing the AP peaks of Cr on the surface of stainless steel, and the residual gas present in the system was found to be composed of H_2O, CO, CO_2, CH_4 and H_2. After bombarding the sample by electron beam for 1 hr, we found the ratio L_3/L_2 of AP peaks of Cr was changed...

The degassing of stainless steel was investigated in a combined equipment including JWC-1 type UHV made stainless steel, SJX-1 quadrupole mass spectrometer and home-made soft X-ray appearence potential spectrometer. We have succeeded in characterizing the AP peaks of Cr on the surface of stainless steel, and the residual gas present in the system was found to be composed of H_2O, CO, CO_2, CH_4 and H_2. After bombarding the sample by electron beam for 1 hr, we found the ratio L_3/L_2 of AP peaks of Cr was changed approximately from 1 to 2 and moreover additional O_2 appeared in the gaseous phase. So, it is reasoned that the O_2 gas is deprived from the thin film of Cr_2O_3 on the surface of the sample which causes the deterioration of the protective film on the surface of stainless steel. This may also take place under conditions of practical use and it could be one of the reasons why stainless steel loses its anti-corrosion properties.

木文介绍用国产JWC-1型无油超高真空机组、SJX-1四极分析器和自制软x射线出现电势能谱仪联合装置研究不锈钢的真空出气特性。获得了山不锈钢制做的无油超高真空系统的残余气体分析谱,主要残余气体是H_2O、CO、CO_2、CH_4和H_2。用电子轰击不锈钢样品主要脱出H_2O、CO、CO_2、CH_4、H_2和O_2记录了未经电子轰击处理和轰击处理1小时后的不锈钢中Cr的软x射线出现电势谱。从谱形看出,未经电子轰击处理不锈钢表面主要有Cr_2O_3层(峰高比L_3/L_2≈1),轰击处理1小时后,Cr_2O_3分解,表面主要出现Cr峰(L_3/L_2>1)。这可能是不锈钢在高温下失去抗腐蚀能力和电子轰击脱氧的原因之一。

Excitation of core-level electrons may occur through a resonantabsorption of characteristic x-rays from a built-in x-ray tube with an anode madeof the same material as that of the sample. Auger electrons may be generated duringthe deexcitation process. By measuring the total yield of photoelectrons as afunction of anode voltage, a new type of appearance potential spectroscopy(APS) ----the resonant photoelectron appearance potential spectroscopy (RPAPS) isobtained. Compared with the soft x-ray APS, RPAPS has...

Excitation of core-level electrons may occur through a resonantabsorption of characteristic x-rays from a built-in x-ray tube with an anode madeof the same material as that of the sample. Auger electrons may be generated duringthe deexcitation process. By measuring the total yield of photoelectrons as afunction of anode voltage, a new type of appearance potential spectroscopy(APS) ----the resonant photoelectron appearance potential spectroscopy (RPAPS) isobtained. Compared with the soft x-ray APS, RPAPS has the advantage of bettersensitivity for the sub-peaks of principal element and peaks for the impuritiesunder the same operating condition. RPAPS causes no damage to the sample,therefore it can be used in the whole range of energy of APS. Results from purenickel and nickel alloys are given for demonstration.

在研究软X射线出现电势谱(SXAPS)和俄歇电子出现电势谱(AEAPS)的基础上,设计了一种新的芯能级谱仪——共振光电子出现电势谱仪。用内装式X光管发射的软X射线照射样品时,如X光管阳极与被照样品为相同材料,则在阳极电压达到出现电势阈值时,所产生的特征X射线将使样品发生共振吸收,而在芯能级上产生空穴,然后在退激发时发射俄歇电子。测定次级电子产额随阳极电压的变化即可得到共振光电子出现电势谱(简写为RPAPS)。用纯镍和镍合金作实验,结果表明,RPAPS对主峰以外的次峰灵敏度和对杂质元素的分辨率均优于同样条件下的SXAPS。初步分析还表明RPAPS与利用连续X射线的光电子出现电势谱(XPAPS)在机理上是不同的。

 
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