Using the couple mode theory, the reflection spectrum, the peak reflectivity and the reflection bandwidth of several typical fiber grating filters have been theoretically analyzed and numerically simulated.
By combining the Runge-Kutta which calculate the reflection spectrum of fiber grating and the nonlinear least square,the parameters of apodized and chirp fiber grating are optimized and its reflection spectrum can meet the different design requirements.
Reflectivity curves of several kinds of heavily-doped III-V compound semiconductors aredrawn in different plasma frequency ωp using computer simulation. The relation between ω,and the sum of ω_1 and ω_2 is found, where ω_1 and ω_2 are frequencies of the high-and low-frequ-ency reflection edge on reflection spectra at the positions of reflectivity minima.
The crystalline structure,electrical property,optical property and surface morphology of ZnO∶Al films sputtered in the argon gas pressure p _ Ar of 0.2～3.2Pa are studied by means of X-ray diffraction (XRD),measurement of transmission and reflection spectra and scanning electron microscopy (SEM).
Based on the coupled mode theory,the chirped Moire grating formed by tow linear chirped fiber gratings was analyzed in detail via the matrix approach. A deeper insight into the relationship among its reflectance spectrum,time delay and the grating parameters,such as the length of the chirped Moire grating,the chirp parameter and the peak refractive index modulation,was obtained.
Interband absorption and features in the reflection spectrum due to interband transitions have been calculated for an arbitrary ratio between the radiative and "phonon" lifetime of a combined polaron have been investigated.
Reflection spectrum of a cholesteric liquid crystal with structural defects
New qualitative features appear in the reflection spectrum of a cholesteric with two defects as the distance between them varies.
Method of the ratio of envelopes of the reflection spectrum for measuring optical constants and thickness of thin films
A spectrophotometric method is proposed that uses the ratio of envelopes of minima and maxima of the interference reflection spectrum for measuring optical constants of a film on a substrate.