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dielectric function
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  介电函数
    Ag/TbFeCo/Si( 100) magneto-optical films was prepared by DC-magnetron sputtering. The dielectric function of the Ag/TbFeCo/Si was measured by alterable angle Ellipsometry. Besides, the spectrum of Ag/Si Ag/TbFeCo/Si and TbFeCo/Si was compared.
    利用直流磁控溅射法制备出Ag/TbFeCo/Si(100)磁光薄膜,利用可变入射角椭圆偏振光谱仪测量了其可见光区的光学常数,给出薄膜介电函数实部和虚部随入射光子能量的变化规律,同时把Ag/Si、Ag/TbFeCo/Si和TbFeCo/Si的光谱进行了比较。
短句来源
    The optical function of the ultrathin Al film is obtained by Newton Raphson method, and dielectric function is calculated.
    采用牛顿 辛普森方法确定超薄Al膜光学函数 ,进而计算其介电函数 ,得到了它们随膜厚变化的关系。
短句来源
    On the base of Drude model,dielectric function and optical constant were calculated. The power reflectance and absorptance of multilayers and their relationship with the number of periodic layers and the thickness of sublayers were acquired with the help of transfer matrix.
    在Drude模型的基础上,计入金属薄膜表面对传导电子弛豫时间的影响,计算了金属的介电函数和光学常数,并利用结构特性矩阵方法计算了金属/电介质多层膜的反射率和吸收率,讨论了金属层厚度、层数对反射率和吸收率的影响
短句来源
    It's interesting to find that the dielectric function of Fe (1-x) Co xSi 2 films is strongly dependent on the phase of the films:a) The dielectric function spectra show interference peaks in the low photon energy range for the β phase Fe (1-x) Co xSi 2 samples;
    实验发现 ,Fe( 1 - x) Cox Si2 薄膜的介电函数强烈地依赖于薄膜的状态 :a)对于 β相的 Fe( 1 - x ) Cox Si2 样品 ,其介电函数谱在红外低能区呈现出干涉峰 ,对应于半导体态 ;
短句来源
    b) The dielectric function spectra show a feature between the semiconductor and metal feature for the samples containing both β and Σ phase Fe (1-x) Co xSi 2;
    b)对于同时存在 β相和 Σ相的混合相 Fe( 1 - x ) Cox Si2 样品 ,其介电函数谱呈现出半导体和金属的混合态特征 ;
短句来源
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  介电常数
    A series of Ni x SiO 2(1- x ) granular films were made by a magnetron rf sputtering system with variation of x and the annealing process. Both the complex dielectric function and magneto optical polar Kerr spectra of the samples were measured at room temperature in the 1.5~4.5eV photon energy range, respectively. It was found that there are new spectral features in the dielectric functions.
    用磁控溅射法制备了一系列 Nix Si O2 (1 - x) 样品 ,并对部分样品作快速退火处理 ,室温下采用椭圆偏振光谱仪和磁光谱仪分别在 1.5~ 4.5 e V的光子能量区测量了样品的复介电常数谱和极向复磁光克尔谱 ,研究了这种金属 -绝缘体型颗粒膜的光学和磁光性质 .
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  “dielectric function”译为未确定词的双语例句
    and the optical constants (Including absorption spectrunu refractive index and dielectric function) of C60 films were measured with the Ellipsometer.
    一1.常温和 77K温度8衬底上C60@膜的制备,以及这两种薄膜的表面结构及
短句来源
    Experimental results indicate that the variation of the pseudo-imaginary part of the dielectric function can give the information about the transformation from the crystalline into amorphous state of the surface layer on rectal by ion implantation.
    实验结果表明,赝介电虚(?) 值的变化可以提供金属表层由晶态到非晶态转变的信息。
短句来源
  相似匹配句对
    Volume is astarget function.
    其中把体积作为目标函数。
短句来源
    Function of Packaging Loss
    包装损失函数
短句来源
    The optical function of the ultrathin Al film is obtained by Newton Raphson method, and dielectric function is calculated.
    采用牛顿 辛普森方法确定超薄Al膜光学函数 ,进而计算其介电函数 ,得到了它们随膜厚变化的关系。
短句来源
    and the optical constants (Including absorption spectrunu refractive index and dielectric function) of C60 films were measured with the Ellipsometer.
    一1.常温和 77K温度8衬底上C60@膜的制备,以及这两种薄膜的表面结构及
短句来源
    Dielectric Film Parameters for Electrochromism
    电致变色中电介质膜参数的研究
短句来源
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  dielectric function
The calculations are based on the exactly solved model of a sharp metal/electrolyte interface, the model of a Born sphere for the ion, and the three-mode approximation for the dielectric function of the solvent.
      
Parameters of the analytical expression used for the dielectric function ε(k) of the solvent are selected so as to reproduce the results of calculations of the ε(k) function obtained by a molecular dynamics method.
      
The complex dielectric function of the films was determined from the experimental data by dispersion analysis of the reflection spectra.
      
This effect is related to the fact that a contribution to the dielectric function of slow ions, determining the scattering amplitude, depends on both spatial and frequency dispersion.
      
The k-dependent semiclassical dielectric function is employed instead of the Lindhard-Mermin expression.
      
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An ellipsometric method is prcscnted for the analysis of the ion-implanted surface layer on metal. Experimental results indicate that the variation of the pseudo-imaginary part of the dielectric function can give the information about the transformation from the crystalline into amorphous state of the surface layer on rectal by ion implantation.

本文探讨了激光椭圆仪对离子注入金属表层的分析方法。实验结果表明,赝介电虚(?)值的变化可以提供金属表层由晶态到非晶态转变的信息。

The complex refractive index and complex dielectric function for the plasma polymerized film starting from aniline have been evaluated from the reflectance and transmittance sprectra using the method of tansfer matrix.In the 0.5μm~2.5μ wavelength range,the optimal value of refractive index for the sample is 1.65±0.05which does not change obviously with λ.The optical gap E0 was detenmied to be 1.8eV form the plot of the quntity versus photon energy hω,This result essentially coincedes with 1. 76eV obtained...

The complex refractive index and complex dielectric function for the plasma polymerized film starting from aniline have been evaluated from the reflectance and transmittance sprectra using the method of tansfer matrix.In the 0.5μm~2.5μ wavelength range,the optimal value of refractive index for the sample is 1.65±0.05which does not change obviously with λ.The optical gap E0 was detenmied to be 1.8eV form the plot of the quntity versus photon energy hω,This result essentially coincedes with 1. 76eV obtained form the absorption spectrum of the sample.

应用传递矩阵方法,从光强反射率和透射率得到苯胺等离子体聚合膜的复数折射率和复数介电函数。在0.5μm~2.5μm波长范围内,膜的折射率nf不随波长明显变化,其最佳值为1.65±0.05。由复数介电函数的虚部得到膜的光学能隙为1.8ev,与从吸收谱得到的结果(E0=1.76ev)基本一致。

Reflection and transmittance of the magnetron sputtered ultrathin Al films in the visible wavelength region has been measured by WFZ900 D4 UV/VIS spectrophotometer. The optical function of the ultrathin Al film is obtained by Newton Raphson method, and dielectric function is calculated. The results show that the ultrathin Al films with different thickness have different electromagnetic characteristics.

利用WFZ90 0 D4型紫外 /可见光分光光度计 ,测量了磁控测射超薄Al膜的可见光反射比和透射比。采用牛顿 辛普森方法确定超薄Al膜光学函数 ,进而计算其介电函数 ,得到了它们随膜厚变化的关系。结果表明 ,不同特征尺寸的薄膜 ,具有不同的电磁特性参数

 
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