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 sheet 板材(1110)
 板材
 To achieve intelligential precision machining of arbitrary space orbit,a eddy current sensor with waterproof type and no contact is designed in view of sheet metal,and eddy current sensor is applied to water jet cutting robot system. 为了实现空间任意轨迹精细加工的智能化,针对金属板材,设计了防水型、非接触式电涡流传感器,并将其应用于水射流切割机器人系统。 短句来源 Modeling and Analysis of the Sheet Metal FMS Based on Extended Colored Timed Petri Nets 基于扩展着色赋时Petri网的板材FMS建模及分析 短句来源 Implementation and Design for Human Interface of Lower Levels Controller on Sheet Metal FMS 板材FMS下位机人机接口的设计与实现 短句来源 Design and Analysis for a Metal Sheet Punching FMC Based on Modularization 基于模块化的板材冲孔FMC设计与分析 短句来源 Mixing scheduling method and its application for sheet metal FMS 板材FMS的混合调度方法及应用 短句来源 更多
 “sheet”译为未确定词的双语例句
 A Study on Monitoring Antarctic Ice Sheet Using Space-borne Microwave Remote Sensing Data 基于星载微波遥感数据的南极冰盖信息提取与变化监测研究 短句来源 Research on Detecting Method for Pulp Fibre and Paper Sheet Quality Based on Image Analysis Technology 基于图像分析技术的纸浆纤维与纸页质量检测方法研究 短句来源 On the Studies the Test Structures of Sheet Resistor 薄层电阻测试结构的研究 短句来源 Model HHF-301 intelligent basis weight measurement system for paper sheet HHF-301型智能化纸页定量测量系统 短句来源 To Realige Quantitative Control for paper Sheet with Model PMK Programmable Controller 用PMK可编程调节器实现纸页定量控制 短句来源 更多

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 sheet
 Let BH = {BH(t ), t ∈ ?N} be an (N, d)-fractional Brownian sheet with index H = (H1, . Let $B^H=\{B^H(t), t\in {\Bbb R}_+^N\}$ be an (N, d)-fractional Brownian sheet with Hurst index H = (H1,...,HN) ∈ (0, 1)N. In particular, we show that offsets to ellipses and hyperbolas are ofnonzero genus except for the circles, and somewhat surprisingly, that offsets to paraboloids and hyperboloids with one sheet can all be rationally parametrized. From the FTIR spectra, it was found that during the transition process of polyamide 618, the intensity of the intra-sheet hydrogen bonds becomes weak. This approach is different from the method of equivalent distributed current sheet and more suitable for electric machines, which have concentrated coils and deeper slots. 更多
 This paper describes the fundamental principle and measuring procedure of Van der Pouw test structure.Seven test structures of this type are fabrica- ted.For inspecting the uniformity of diffusion,we measured the sheet resistances of base and emitter regions using the circular VDP test structure and four different types of cross sheet resistor test structures.Different str- uctures give nearly the same results.We measured the effective width of window with the cross-bridge sheet resistor test... This paper describes the fundamental principle and measuring procedure of Van der Pouw test structure.Seven test structures of this type are fabrica- ted.For inspecting the uniformity of diffusion,we measured the sheet resistances of base and emitter regions using the circular VDP test structure and four different types of cross sheet resistor test structures.Different str- uctures give nearly the same results.We measured the effective width of window with the cross-bridge sheet resistor test structure and measured the resistivity of the substrate crystal with the planar four probes test structure. All results indicate that the test structure is indeed an available tool for process control. 本文叙述了 Van der Pauw(VDP)测试结构的基本原理及测量方法。试制了七种这类的测试结构。用圆形 VDP 结构和四种不同形状的十字形结构对基区、发射区的薄层电阻进行了测量,以检查扩散的均匀性,不同结构测得结果基本相符。用十字——桥结构测量了窗口的有效宽度,用平面四探针结构为测量了单晶衬底的电阻率。结果说明测试结构确是监察工艺的有效工具。 By analysing and comparing the magnetic field distributions for both helix current model and current model, it has been proved that the average of the field for the helix current over the polar angle is exactly equal to the field for the corresponding current sheet, no matter what size of the pitch will be. As a matter of fact, the field for the helix current is equivalent to the superposition of the field for the current sheet and a small sinusoidal quantity, which can be neglected when the pitch... By analysing and comparing the magnetic field distributions for both helix current model and current model, it has been proved that the average of the field for the helix current over the polar angle is exactly equal to the field for the corresponding current sheet, no matter what size of the pitch will be. As a matter of fact, the field for the helix current is equivalent to the superposition of the field for the current sheet and a small sinusoidal quantity, which can be neglected when the pitch is small enough. Furthermore, the integral average of the field for the helix current over the spherical sample placed at center of the solenoid is equal to the center field. These results have practical importance for further development of the determination of gyromagnetic ratio of proton in the weak field. 本文用解析的方法讨论并比较了螺旋线电流和电流片这两种不同模型的磁场分布,从而证明了螺旋线电流的磁场沿极角方向的平均值正好等于电流片的磁场,而不管螺旋线的螺距有多大。进一步,我们可将螺旋线电流的磁场表示为电流片的磁场与一个微小正弦量的迭加,这个正弦量在螺距足够小时可被忽略不计。结果,螺旋线的磁场在位于螺管中心的球形样品上的积分平均值即等于中心点的磁场。这些结果对于进一步改进和提高在弱磁场中质子回旋磁比Y＇_p的测定具有实际意义。 This paper describes the fundamental principle and measuring procedure of Van der Pouw test structure. Seven test structures of this type are fabricated. For inspecting the uniformity of diffusion, we measured the sheet resistances of base and emitter regions using the circular VDP test structure and four different types of cross sheet resistor test structures. Different str- uctures give nearly the same results. We measured the effective width of window with the cross-bridge sheet resistor... This paper describes the fundamental principle and measuring procedure of Van der Pouw test structure. Seven test structures of this type are fabricated. For inspecting the uniformity of diffusion, we measured the sheet resistances of base and emitter regions using the circular VDP test structure and four different types of cross sheet resistor test structures. Different str- uctures give nearly the same results. We measured the effective width of window with the cross-bridge sheet resistor test structure and measured the resistivity of the substrate crystal with the planar four probes test structure. All results indicate that the test structure is indeed an available tool for process control. 本文叙述了Van der Pauw(VDP)测试结构的基本原理及测量方法。试制了七种这类的测试结构。用圆形VDP结构和匹种不同形状的十字形结构对基区、发射区的薄层电阻进行了测量,以检查扩散的均匀性,不同结构测得结果基本相符。用十字——桥结构测量了窗口的育效宽度,用平面四探针结构测量了单晶衬底的电阻率。结果说明测试结构确是监察工艺的有效工具。 << 更多相关文摘
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