Based on the test circuit of GB2313 80 it makes contrast experiments of practical power consumption for 40 watt,pipe diameter T 8-T 12 fluorescent tubes,draws a conclusion of 11% power saving by attaching GB2313-93 ballast to T 8 fluorescent tube using experimental data,meanwhile deduces a estimating formula of practical power consumption deviation of T 8-T 12 fluorescent tube.
The system is composed of a computer, a programmable DC power supply Agilent 6626A, a 82350A GPIB card, a data collect card PC-6342, a D/A card PCI-6208V, 4 mass flow controllers made by UNIT, 2 DC power supply made in TaiWan, test gas, test chamber and semiconductor gas sensors test circuit.
Based on the Mayr arc equation, the arc resistance model used in PSCAD simulation is fabricated. Employed this arc resistance model, the circuit breaker interrupting performance of the direct test circuit, the Hitashi four-parameter synthetic test circuit and the EPIC circuit proposed by ABB are simulated. The arc process and transient recovery voltage are compared.
The terminal voltage of the control coil is detected by the test circuit. Then the signal containing the information of rotor displacement is obtained ,from which we can get the DC voltage signal proportional to the rotor displacement through half-wave rectification circuit and low pass circuit. This DC signal is put into a PID controller to get the control signal of the rotor displacement.
On the basis of introducing the characteristics and effect of virtual instruments and sensors in brief, a new measurement method of accomplishing making-breaking capacity test of switching apparatus by using virtual instruments and sensors was brought forward, and the test circuit was also introduced.
This paper examines the effect of a series of no-clean solder pastes on signal integrity using an RF test circuit which sends a broadband signal through a gallium arsenide antenna switch and measures its transmission using a network analyzer.
A new "linear test circuit" has been developed to overcome this deficiency.
A novel test circuit for automatically detecting electrochemical migration and conductive anodic filament formation
State special standard of units of spectral transmission and reflection coefficients and the All-Union Test Circuit for color me
From simulation and measurement results of a feasibility study performed on a general purpose test circuit realised in 0.35 μm technology, the applicability was demonstrated.