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dielectric
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  介电
    Investigation on ECR Plasma Deposition and Dielectric Property of SiCOH Low-k Films
    SiCOH低k薄膜的ECR等离子体沉积与介电性能研究
短句来源
    Research on Non-linear Dielectric Properties of STO Thin Films and Its Microwave Applications
    STO薄膜的非线性介电性质及其微波应用研究
短句来源
    Positron Annihilation Study of Complex-Defect in Sr-Bi-Ti-O Dielectric Ceramics
    钛酸锶铋介电陶瓷中复合缺陷的正电子湮没研究
短句来源
    Measurement of Dielectric Properties of Dielectric Resonator at Microwave Frequencies
    微波介质谐振器介电参数的测量
短句来源
    DIELECTRIC AND FERROELECTRIC PROPERTIES OF BaTiO 3 THIN FILMS PREPARED BY PULSED LASER DEPOSITION
    脉冲激光淀积BaTiO_3薄膜的介电与铁电特性
短句来源
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  电介质
    OPTICAL PROPERTIES OF METAL/DIELECTRIC MULTILAYERS
    金属/电介质多层膜的光学特性
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    Properties of High-k Gate Dielectric LaAlO_3 Thin Films
    高介电常数的栅极电介质LaAlO_3薄膜的性能研究
短句来源
    Influencing factors on structural properties of Sn dielectric thin films
    影响Sn电介质绝缘薄膜结构特性的因素
短句来源
    Numerical Study on Conjugate Heat and Mass Transfer Process within Porous Media with Dielectric Cores during Microwave Freeze Drying
    具有电介质核心多孔介质微波冷冻干燥过程的耦合传热传质的数值研究
短句来源
    On the base of Drude model,dielectric function and optical constant were calculated. The power reflectance and absorptance of multilayers and their relationship with the number of periodic layers and the thickness of sublayers were acquired with the help of transfer matrix.
    在Drude模型的基础上,计入金属薄膜表面对传导电子弛豫时间的影响,计算了金属的介电函数和光学常数,并利用结构特性矩阵方法计算了金属/电介质多层膜的反射率和吸收率,讨论了金属层厚度、层数对反射率和吸收率的影响
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  “dielectric”译为未确定词的双语例句
    Investigation of High Dielectric Ta_2O_5 Thin Films Deposited by Reactive Sputtering
    反应溅射沉积高介电Ta_2O_5薄膜研究
短句来源
    The magnet- optical films of TbFeCo/Si and TbFeCo/K9 were prepared on the Si and K9-glass substrates by magnetron sputtering system with SPS TbFeCo alloy target. The spectra of complex dielectric functions were measured by spectroscopic ellipsometry at room temperature.
    采用放电等离子烧结(SPS)TbFeCo合金靶,分别在Si衬底和K9玻璃衬底上磁控溅射制备了磁光薄膜TbFeCo/Si和TbFeCo/K9;
    Investigation of structure and dielectric properties of TiO_2 thin films grown by LPMOCVD
    低压MOCVD生长TiO_2薄膜结构和电性能研究
短句来源
    Multi-layer Dielectric Film for Pulse Compressed Gratings
    脉宽压缩光栅用多层膜制备和性能测试
短句来源
    Improved dielectric and ferroelectric characteristicsof highly (111)-oriented Pb(Zr_(0.52)Ti_(0.48))O_3films produced by Sol-Gel method
    (111)择优取向的Pb(Zr_(0.52)Ti_(0.48))O_3铁电薄膜的制备及研究
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  dielectric
Because of the existence of nanopores, the dielectric constant of PI films decreased by a wide margin and was less than 2.0 at a PU mass fraction of 20%.
      
It implies that this is an effective means to reduce the dielectric constant of PI, but it also causes the decrease of tensile strength and the rise of water absorption.
      
Lead zirconium titanate (PZT) films (Zr/Ti=45:55) with a high dielectric constant are prepared successfully on the low-resistance Si substrate in sol-gel dip-coating process with PT film used as the buffer layer.
      
The dielectric and ferroelectric properties of the films as well as the relationship between crystallization and preparing condition are studied.
      
The relative dielectric constant εr and the dissipation factor tgδ of the PZT thin films were measured with an LCR meter and were found to be 158 and 0.04-0.005, respectively.
      
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The further improvement of the reflectance of the laser mirrors is restricted by the absorbing and scattering losses. In this paper we will discuss the absorbing and scattering theory of rnultilayer dielectric reflectors and the approach to the reduction of losses and to the increase of reflectance, there is a low loss in nineteen layers of ZnS/MgF2-ThF_4 stacks whose design is based on the standing wave field in the mirrors. Experiment has confirmed that it is possible to produce excellent rnerrors which...

The further improvement of the reflectance of the laser mirrors is restricted by the absorbing and scattering losses. In this paper we will discuss the absorbing and scattering theory of rnultilayer dielectric reflectors and the approach to the reduction of losses and to the increase of reflectance, there is a low loss in nineteen layers of ZnS/MgF2-ThF_4 stacks whose design is based on the standing wave field in the mirrors. Experiment has confirmed that it is possible to produce excellent rnerrors which result in a loss of less than 0.2% and a reflectance of about 99.8%.

激光反射镜中的吸收散射损耗,限制了反射率的进一步提高。本文讨论反射镜的吸收散射理论以及减小损耗、提高反射率的途径。基于反射镜中的驻波场分布,设计的19层ZnS/MgF_2—ThF_4组合膜系,具有极小的光学损耗。实验证实,制备损耗低于0.2%和反射率高达99.8%的优质反射镜是完全可能的。

The time-dependent temperature distribution of thin aluminium films with a layer of dielectric passivation, emphatically the influence of the kind and the thickness of dielectric films on this distribution, has been studied numerically using the finite difference method. It shows that the peak temperature and temperature gradient of thin aluminium films can be greatly reduced by using dielectric passivation of Si8N4(or Al2O3) with high thermal conductivity which is very beneficial to improving...

The time-dependent temperature distribution of thin aluminium films with a layer of dielectric passivation, emphatically the influence of the kind and the thickness of dielectric films on this distribution, has been studied numerically using the finite difference method. It shows that the peak temperature and temperature gradient of thin aluminium films can be greatly reduced by using dielectric passivation of Si8N4(or Al2O3) with high thermal conductivity which is very beneficial to improving electromigration lifetime and anti-surge-current ability of aluminium films.

本文采用有限差分法,数值研究了具有介质钝化层的铝薄膜上的瞬态温度分布,着重研究了介质膜种类及厚度对这一分布的影响。结果指出,采用高热导率的Si_3N_4(或Al_2O_3)介质膜钝化,可以大幅度地降低铝薄膜的峰值温度及温度梯度。这对提高铝膜的电徙动寿命及抗电流浪涌能力是非常有益的。

An ellipsometric method is prcscnted for the analysis of the ion-implanted surface layer on metal. Experimental results indicate that the variation of the pseudo-imaginary part of the dielectric function can give the information about the transformation from the crystalline into amorphous state of the surface layer on rectal by ion implantation.

本文探讨了激光椭圆仪对离子注入金属表层的分析方法。实验结果表明,赝介电虚(?)值的变化可以提供金属表层由晶态到非晶态转变的信息。

 
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