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dielectric     
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  介电
    The Study of Dielectric Properties of Ba(Zn_(1/3)Nb_(2/3))O_3 Microwave Dielectric Ceramics
    Ba(Zn_(1/3)Nb_(2/3))O_3微波介质陶瓷介电性能的研究
短句来源
    Structures, Ferroelectric and Dielectric Properties of Bismuth Layer-structured Compounds
    铋层状化合物的结构与铁电、介电性能
短句来源
    Studies on Barium Strontium Titanate Nonlinear Dielectric Thin Films with High Dielectric Tunability and Low Dissipation Factor
    钛酸锶钡非线性介质薄膜的高介电调谐率和低介电损耗的研究
短句来源
    Dielectric Strength Recovery Characteristics Post-zero of High Current in SF_6
    SF_6气体中大电流过零后弧道的介电恢复特性
短句来源
    Dielectric, Piezoelectric and Pyroelectric Properties of BaO-TiO_2-SiO_2 Glass-Ceramics
    BaO—TiO_2—SiO_2玻璃陶瓷的介电、压电和热电性
短句来源
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  介质
    The Study of Dielectric Properties of Ba(Zn_(1/3)Nb_(2/3))O_3 Microwave Dielectric Ceramics
    Ba(Zn_(1/3)Nb_(2/3))O_3微波介质陶瓷介电性能的研究
短句来源
    Investigation and Realization of Key Technologies on High Power Supply of Dielectric Barrier Discharge Ozone Generation
    大功率介质阻挡放电臭氧发生电源的关键技术研究与实现
短句来源
    Computation and Analysis on Dielectric Recovery Characteristic in High Voltage SF_6 Circuit Breaker
    高压SF_6断路器介质恢复特性的计算与分析
短句来源
    Studies on Barium Strontium Titanate Nonlinear Dielectric Thin Films with High Dielectric Tunability and Low Dissipation Factor
    钛酸锶钡非线性介质薄膜的高介电调谐率和低介电损耗的研究
短句来源
    The Principle and Method for Measuring Capacitor Dielectric Absorption
    电容器介质吸收效应的测量原理和测试方法
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  电介质
    A STUDY ON ULTRA SLOW DIELECTRIC RELAXATION
    电介质超慢弛豫过程的研究
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    Suggestion for Revising the Definition of the Dielectric Loss Angle
    关于修改电介质损耗角定义的建议
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    Dielectric life test with cut-tail sample in groups and estimation of distribution parameters
    固体电介质寿命试验的分组截尾样本及分布参数估计
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    DIELECTRIC AND INTELLIGENT MATERIAL
    电介质和智能材料
短句来源
    DIELECTRIC BREAKDOWN OF FERROELECTRIC CERAMICS PZT-95/5 UNDER SHOCK COMPRESSION
    冲击波压缩PZT-95/5铁电陶瓷的电介质击穿
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    Test of the Voltage Coefficients of Dielectric Loss and Capacitance
    损电压系数及电容电压系数的试验
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    Dielectric Loss Measurement and Its New Development
    损测量技术及其最新发展
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    A Comprehensive Experimental Analysis of 500 kV Current Transformers With Abnormal Dielectric Losses
    对损异常的 500 kV 电流互感器的试验解剖分析
短句来源
    Progress in technique of power cable dielectric loss measurement under 0.1Hz
    0.1Hz下电缆损测量技术的进展
短句来源
    Influence of environment on dielectric loss test of transformer bushing
    环境因素对油纸电容式套管损试验的影响
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  dielectric
Because of the existence of nanopores, the dielectric constant of PI films decreased by a wide margin and was less than 2.0 at a PU mass fraction of 20%.
      
It implies that this is an effective means to reduce the dielectric constant of PI, but it also causes the decrease of tensile strength and the rise of water absorption.
      
Lead zirconium titanate (PZT) films (Zr/Ti=45:55) with a high dielectric constant are prepared successfully on the low-resistance Si substrate in sol-gel dip-coating process with PT film used as the buffer layer.
      
The dielectric and ferroelectric properties of the films as well as the relationship between crystallization and preparing condition are studied.
      
The relative dielectric constant εr and the dissipation factor tgδ of the PZT thin films were measured with an LCR meter and were found to be 158 and 0.04-0.005, respectively.
      
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This paper ivestigates some problems of the interface between the P-N junction surface of high voltage Si semiconductor devices and the surface of protection dielectric. The authors have analyzed the reverse leakage current charaeteristies depending upon the voltage and presented the passivation coefficients B_(ID), B_K, which are used to quantitatively discuss the surface passivation effect and to distinguish the behavior of protection dielectrics. Using these two parameters, the authors have studied...

This paper ivestigates some problems of the interface between the P-N junction surface of high voltage Si semiconductor devices and the surface of protection dielectric. The authors have analyzed the reverse leakage current charaeteristies depending upon the voltage and presented the passivation coefficients B_(ID), B_K, which are used to quantitatively discuss the surface passivation effect and to distinguish the behavior of protection dielectrics. Using these two parameters, the authors have studied experimently the effect of the constructions of polymers, constitutions of side groups, purity and fillers in the silicon varnishes and rubbers on surface passivation. The researches have ahown that a modified silicon varnish which has more benzene groups on the side and higher purity is more suitable for surface passivation.

本文研究高压硅半导体器件P-N结表面与表面保护材料的界面问题,作者分析了反向漏电流随电压的变化规律,在此基础上提出钝化系数B_(ID)、B_K,用以定量地讨论钝化作用和鉴别保护材料的质量。同时,用这些参数作者实验研究了现今用于PN结表面钝化的硅漆和硅橡胶中聚合物结构、侧基的组成、纯度及填料对钝化作用的影响,结果表明侧基中苯基较多,纯度较高的改性硅漆对于表面钝化作用是比较优良的。

This paper describes the circuit analysis and design of a versatile corona (discharge) detector. The instrument is designed on the basis of current pulse method to detect the partial discharge of the insulating materials, and internal discharges occurring in inclusions of low dielectric strength in a dielectric.This instrument is appropriate for testing cables, capacitors, transformers, bushings, coils of high voltage machines, etc. A 130mm flat-faced cathode-ray tube is used to display the discharges...

This paper describes the circuit analysis and design of a versatile corona (discharge) detector. The instrument is designed on the basis of current pulse method to detect the partial discharge of the insulating materials, and internal discharges occurring in inclusions of low dielectric strength in a dielectric.This instrument is appropriate for testing cables, capacitors, transformers, bushings, coils of high voltage machines, etc. A 130mm flat-faced cathode-ray tube is used to display the discharges which are imposed on elliptical time base. This instrument provides two detecting method: direct one and balance one. An artificial discharge of calibrated magnitude supplied to the low voltage part of the detection circuit is used to comparewith the real discharge, thus the involved electric quantity may be determined. The calibration impules may be regulated to move along the elliptical time base.

本文介绍了一种繁用的局部放电检测仪的电路原理和设计要求。仪器是基于电流脉冲法进行设计的,用来检测绝缘材料中的局部放电,或电介质中低介电强度的杂质的放电等。仪器适用于测试电缆、电容器、互感器、套管和高压电机的线圈等。用130mm的平面阴极射线管作为放电脉冲信号的显示元件,放电信号叠加在椭圆时基上,观察方便。仪器提供了“直接法”和“平衡法”两种测试方法。在检测电路的低压部分注入一个已知量的校正脉冲信号,通过与实际放电信号的比较来求取其放电量的大小,校正脉冲可以控制使它能沿椭圆时基移动,使用比较简单。

The measurement of the dielectric loss of insulating materials or electrical apparatus with the Schering Bridge under power frequency is one of the most fundamental dielectric tests for evaluating the insulation behavior. It has been pointed out that a regative error or even an apparent negative roading of tgδ may result if there is a T-network of disturbance present in the measuling circuit or within the test sample itself, but these phenomena have not yet been fully investigated. The purpose of...

The measurement of the dielectric loss of insulating materials or electrical apparatus with the Schering Bridge under power frequency is one of the most fundamental dielectric tests for evaluating the insulation behavior. It has been pointed out that a regative error or even an apparent negative roading of tgδ may result if there is a T-network of disturbance present in the measuling circuit or within the test sample itself, but these phenomena have not yet been fully investigated. The purpose of our investigation is to find out the origin of such phenomena. This paper also discusses such phenomena occurring in Three-Terminal measurement of dielectric materials. The opinion of some foreign authors that the negative error of tgδ reading under power frequency is duo to the presence of resistance in. The guard electrode circuit, and also their suggestion that the second guard electrode method should be used as a remedy have been pointed out to be incorrect. The paper suggests a possible model of the T-network of disturbance present inside the sample itself and points out the fact that another form of the T-network disturbance, the induction through electric field, may also cause a negative increment of tgδ reading. Finally, the paper proposes a few points for consideration in taking correct measurements both of insulating materials and electric apparatus such as condenser bushings etc.

用西林电桥在工频下测量绝缘材料或绝缘结构的介质损耗是评价绝缘性能的最基本试验之一。如果在测试电路或试样本身内存在T形干扰网络,则tgδ测量值就可能出现负误差或甚至出现负值。但是,这一现象迄未进行详细的研究和报道。本文研究的目的是试图找出这一现象的来源,讨论了三电极材料试样产生这一现象的问题,指出某些外国文献认为工频下负损耗来源于保护线路电阻的论述以及所提出第二保护极补偿方法是不正确的。本文提出了试样本身存在负损耗T形干扰网络的可能模型,同时指出了T形干扰网络的另一形式即空间电场感应也可以产生负损耗。最后,本文提出了绝缘材料和绝缘结构如电容套管在介质损耗测试时的某些注意事项。

 
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