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combinational logic
相关语句
  组合逻辑
    Function Minimization of Combinational Logic Cad Based on XOR Gate
    基于“异或”门的组合逻辑化简CAD
短句来源
    Combinational Logic
    组合逻辑
短句来源
    A NEW METHOD OF SEQUENTIAL LOGIC SYNIHESIS BASED ON COMBINATIONAL LOGIC MINIMIZATION
    基于组合逻辑最小化技术的时序逻辑综合方法
短句来源
    Function minimization of combinational logic CAD based on XOR gates develops traditional design method. XOR gates are used as basic logic gates, a practical method for computer automatic logic design is developed.
    基于“异或”门的组合逻辑化简CAD发展了传统的设计方法,把“异或”门作为基本逻辑门,研究出计算机自动逻辑设计的实用方法。
短句来源
    By dividing RTL description into combinational logic and sequential logic, the method reuses the combinational logic synthesis and sequential logic synthesis in the controller synthesis, thus reducing the time used in developing RTL synthesis.
    提出一种通过将RTL描述划分为时序逻辑与组合逻辑后 ,重用控制器综合中的组合逻辑综合和时序逻辑综合实现 RTL综合的方法 . 此方法有效地利用了已有的成熟技术 ,为缩短 RTL综合的开发时间提供了一种有效途径
短句来源
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  组合逻辑电路
    DIGITAL MULTIPLEXER AND MATRIX EQUATION IN DESIGNING COMBINATIONAL LOGIC CIRCUIT
    采用数据选择器和矩阵方程法设计组合逻辑电路
短句来源
    Simulation of Combinational Logic Circuits Based on Petri Net
    组合逻辑电路的Petri网仿真分析
短句来源
    Application of First Degree Boolean Difference for Test Generation of Combinational Logic Circuit
    一阶布尔差分在组合逻辑电路测试生成中的应用
短句来源
    An Investigation into the Application of OBDD to the Test Generation of Combinational Logic Circuits
    OBDD在组合逻辑电路测试中的应用研究
短句来源
    Evolvable algorithms are applied to functional digital combinational logic circuits with the structure of ClassicEPGlO chip of Altera Co. and the detailed analyses of typical examples are also given.
    结合Altera公司ClassicEP610芯片的结构,研究了将演化算法应用于函数级数字组合逻辑电路的硬件演化,并且对典型实例进行了详细分析。
短句来源
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  “combinational logic”译为未确定词的双语例句
    Study of a Simplification Method Using the Karnaugh Map for Multi-Output Combinational Logic Functions
    多输出组合逻辑函数共卡诺图化简法的研究
短句来源
    ECL-ULG combinational logic and sequential logic are also introduced.
    对于ECL-ULG的组合逻辑和时序逻辑在文中也作了简单介绍。
短句来源
    In designing auto-control devices including computer, apart from the combinational logic design, the now fairly popular method which attracts daily increasing attention is the microprogramming.
    设计包括计算机在内的自动控制装置,除采用组合逻辑设计方法外,目前比较流行、且愈来愈为人们重视的方法,是微程序设计方法。
短句来源
    The conventional test generation algorithms for combinational logic c ircuits,such as D algorithm、PODEM algorithm and FAN algorithm etc,hav e to go on the backtrack during the search,which greatly affects the ir efficiency.
    由于传统的组合电路测试方法 ,如 D算法、PODEM算法和 FAN算法等 ,在搜索过程中都不可避免地要进行反向回溯 ,因此严重地影响了算法的效率。
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  combinational logic
Novel scalable SoC architectures based on simple combinational logic are proposed to eliminate dedicated multipliers with at least $10 \times$saving in hardware resource.
      
One of the major factors which contribute to the power consumption in CMOS combinational logic circuits is the switching activities in the circuits.
      
By reducing the number of binary inputs to combinational logic and merging algorithm steps, the strategy creates new simplified functions to decrease logic depth and area.
      
The synchronization of internal computations is achieved by balancing inherent RC delays of combinational logic elements, thus allowing circuits to be pipelined at a very fine-grain level.
      
Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPG
      
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In this paper a very-high speed BCL universal logic gate (ECL-ULG) with simple structure and powerful function is presented, which can be applied as a basic cell of ECL-LSI gate arrays. The mathematical properties of AND-OE universal logic gates and the principles of two-variable ECL-ULGr circuits are discussed. ECL-ULG combinational logic and sequential logic are also introduced.

本文提出用ECL通用逻辑门(ECL-ULG)作ECL-LSI门阵列的基本单元。ECL-ULG结构简单、逻辑灵活、连线少和速度快。文章着重论述AND-OR通用逻辑门的数学性质和二变量的ECL-ULG线路原理。对于ECL-ULG的组合逻辑和时序逻辑在文中也作了简单介绍。

In designing auto-control devices including computer, apart from the combinational logic design, the now fairly popular method which attracts daily increasing attention is the microprogramming. Control storage is the key element of microprogrammable controller. This paper elaborates on the function and position played by the said control storage in microp- rogram-control digital system, and evaluates its development, basic prin- ciples and characteristics by means of citing several types of control storages....

In designing auto-control devices including computer, apart from the combinational logic design, the now fairly popular method which attracts daily increasing attention is the microprogramming. Control storage is the key element of microprogrammable controller. This paper elaborates on the function and position played by the said control storage in microp- rogram-control digital system, and evaluates its development, basic prin- ciples and characteristics by means of citing several types of control storages. The paper devotes quite a large space to expounding the adoption of SSI direct-control microprogramming and the PLA micro-controler's logic structure as well as its effect for data storage. The influence exer- ted by different control storages on microcontroller's structure and the optional programs for control storage investigated by this paper are of reference value for practical designing.

设计包括计算机在内的自动控制装置,除采用组合逻辑设计方法外,目前比较流行、且愈来愈为人们重视的方法,是微程序设计方法。该方法的控制存贮器是微程序控制器的关键设备。本文阐述它在微程序控制数字系统中的作用与地位;通过列举若干类型的控存,对其发展、原理与特点作了评价;并以较大篇幅论述了采用小规模组件的直控法微程序设计和采用PLA的微控器逻辑结构及其存贮信息的效率。文中所述的不同控存对微控器结构的影响,以及对控存方案的选择意见,可供设计时参考。

Because of the special features of microprocessor chips, the traditional testing approaches, either testing a combinational logic circuit or testing a sequential logic circuit, are no longer saris factory to microprocessor testing. This paper, according to the inherent modular structure of microprocessor and those characteristics of each module, has presented the relevant testing approaches. On the basis of corresponding test methods of each module, the whole functional test program is programed...

Because of the special features of microprocessor chips, the traditional testing approaches, either testing a combinational logic circuit or testing a sequential logic circuit, are no longer saris factory to microprocessor testing. This paper, according to the inherent modular structure of microprocessor and those characteristics of each module, has presented the relevant testing approaches. On the basis of corresponding test methods of each module, the whole functional test program is programed by using the programming principle of extending testod range shep by step.

由于微处理器芯片电路的特殊性,传统的测试组合逻辑电路或时序逻辑电路的方法,已不再完全适合于测试微处理器芯片电路。本文拟针对微处理器芯片电路的固有模块结构,并结合各模块的具体特点,提出相应的测试方法。在各模块相应的测试方法基础上,采用逐步扩展测试范围的编排原则,编制整个微处理器功能测试程序。

 
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