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accelerated life     
相关语句
  加速寿命
     1. Constant stress accelerated life test.
     1. 恒定应力加速寿命试验,简称恒加试验.
短句来源
     Statistic Analysis on Accelerated Life Test Data for Infrared LED Based on LSM
     基于LSM的红外LED加速寿命试验数据的统计分析
短句来源
     Results for Accelerated Life Test of Model WT55 1.25cm-Gunn Diodes
     WT55型1.25厘米体效应管加速寿命试验
短句来源
     3. Progressive stress accelerated life test.
     3. 序进应力加速寿命试验,简称序加试验.
短句来源
     THE ACCELERATED LIFE TEST STUDY FOR V-BELT
     V带的加速寿命试验研究
短句来源
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  加速寿命实验
     Based on the accelerated life experiment and the measurement and analysis of the resistance and 1/fγ noise of metal film interconnects in VLSI with different levels of electromigration damages, we get the experimental law that the power density at 3?
     通过对超大规模集成电路金属互连进行电迁移加速寿命实验和不同电迁移损伤程度的金属薄膜电阻及1/fγ噪声的测量和分析,得到了1/fγ噪声3Hz点功率谱密度和频率指数γ均随电迁移损伤程度加剧而变大的实验规律.
短句来源
     Strength and bending resistance test, welding heat test and highly accelerated life test (HALT) were retested up to grade.
     经瓷体强度实验、抗弯曲实验、耐焊接热实验、加速寿命实验,其各项指标均合格。
短句来源
     An accelerated life test studied on carbon black/polyethylene composites
     聚乙烯碳黑PTC材料加速寿命实验研究
     Based on the similarity theory of the accelerated life test,the accelerated life test of concrete was carried out with the multi-channel and adjustable-voltage chloride ion penetration test setup.
     基于寿命加速实验的相似理论,采用多通道变电压氯离子渗透实验装置对混凝土进行了加速寿命实验
短句来源
     With a simulating accelerated life test, the degradations of bridgewire resistance, 50% firing current, ignition delay time, bridgewire molten time and powder color changed with the storage time are measured. The most sensitive parameter suitable to evaluate the storage life of the same kind of the squibs is discussed.
     通过模拟加速寿命实验,测定了某型号电点火头的桥丝电阻、50%发火电流、点火延迟时间、桥丝熔断时间、药剂颜色随贮存时间的蜕变,讨论了哪种参量最适合作为评价该类电火工品贮存寿命的问题。
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  “accelerated life”译为未确定词的双语例句
     The Accelerated Life Test Method for Impulse Power Capacitors
     脉冲电容器的快速寿命试验方法 The Accelerated Life Test Method for Impulse Power Capacitors
短句来源
     A New Way to Estimate The Parameters in the Progressive Stress Accelerated Life Testing
     A New Way to Estimate The Parameters in the Progresive Stres Acelerated Life Testing
短句来源
     The anode possesses relatively low overpotential,when the coexistence ofβ-MnO_2 andα-Mn_2O_3.The Ti/SnO_2+Sb_2O_3/MnO_x electrode,the MnO_x coatings prepared at 400℃,exhibits excellent electrocatalytic activity and higher coating stability with accelerated life of 39h.
     焙烧温度高于450℃时,在实验条件下,只有α-Mn_2O_3的衍射峰.焙烧温度对电极电催化活性和电极寿命有显著的影响,α-Mn_2O_3和β-MnO_2共存时电极具有较低的析氧电位.焙烧温度为400℃时制备的电极电催化活性较高,快速寿命检测法测得其电极寿命达39h,具有良好的稳定性.
短句来源
     Application of Residual GM(1,1) Model in Constant Stress Accelerated Life Testing
     残差GM(1,1)模型在恒加试验中的应用
短句来源
     Accelerated life tests were performed at 60℃ and 1.0 mol/L in aqueous H2SO4 with an anodic current of 2.0 A/cm2. The experimental results show that the accelerated lifetime decreases with increasing RuO2 content,but comparing with the electrodes without an intermediate layer, the accelerated lifetime of Ti/SnO2+Sb2O3/RuO2+PbO2 electrodes is prolonged obviously.
     相同的扫描速率下,RuO2含量增加,电极的伏安电荷值增加,即电极的电催化活性随着RuO2含量的增加而增加。 在1.0mol/LH2SO4溶液中,60℃、电流密度为2.0A/cm2条件下,电极寿命快速检测结果表明,Ti/SnO2+Sb2O3/RuO2+PbO2电极的寿命随RuO2含量的增加而下降;
短句来源
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  accelerated life
This new MFD can further decrease the thrust by 21.3 % over the heuristic MFD, and accelerated life tests haveshowna25% further increase in drill life.
      
Under accelerated life test conditions, this new drill can decrease thrust force by 21.0% and increase drill life by 50% compared to a split-point drill.
      
Model correlation with test data is discussed and applied to the accelerated life test design.
      
Accelerated life testing (few cycles, larger temperature excursions) is often a practical necessity in predicting fatigue life in field environments (many cycles, smaller temperature excursions).
      
A dynamic model for solder and the problem of accelerated life testing
      
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In Fe-25Cr-5Al electrical resistance alloy, the presence of 0.103% La, 0.092%Ce, 0.068% mischmetal or 0.25% Yappeared to increase its service life significantlyeither found by accelerated life testing or by isothermal life testing procedurerespectively. There is also a rise in strength of oxide scales formed on the wiresurface.It is found that the distribution of alloying elements in the oxide scale ischanged markedly by the addition of RE. The enrichment of Fe and Cr ions inthe inner layer of the...

In Fe-25Cr-5Al electrical resistance alloy, the presence of 0.103% La, 0.092%Ce, 0.068% mischmetal or 0.25% Yappeared to increase its service life significantlyeither found by accelerated life testing or by isothermal life testing procedurerespectively. There is also a rise in strength of oxide scales formed on the wiresurface.It is found that the distribution of alloying elements in the oxide scale ischanged markedly by the addition of RE. The enrichment of Fe and Cr ions inthe inner layer of the α-Al_2O_3 scale is suppressed, and in Y-containing alloy, theenrichment of Y in the scale causes the formation of Y_3Al_2(AlO_4)_3 phase (YAG).Both may give rise to the improvement of cohesion within the oxide scale whichwould in turn contribute significantly to the increase in service life of the alloy.

0.103%La,0.092%Ce,0.068%(Ce+La)混合稀土和0.25%Y皆能成倍提高0Cr25Al5电热合金的快速寿命和恒温寿命,显著提高合金丝表面氧化皮在高温下的强度.合金添加稀土后,抑制了α-Al_2O_3氧化皮内层Fe,Cr离子的富集,在加Y合金的外氧化皮中还高度富集了Y_3Al_2(AlO_4)_3相(YAG),提高了氧化皮本身的结合力,这可能是稀土元素提高Fe-Cr-Al合金高温寿命的主要原因.

Results for accelerated life test of model WT55 1.25cm-Gunn diodes are presented under typical dc operation conditions and with ambient temperature as a stress of acceleration.

本文给出了WT55型1.25厘米体效应管加直流工作点,以环境温度为加速变量的寿命试验结果.器件的突然烧毁严重影响其可靠性,使失效率约为10~(-5)/小时.然而,试验表明,器件实际寿命可达数百万小时.高温直流功率负荷筛选能有效地淘汰早期失效器件,尤其是淘汰突然烧毁失效器件.选择适当的筛选条件,将使器件在40℃环境温度下工作时,获得低于1000菲特的失效率.文章讨论了筛选条件的选择.严格封帽前的镜检,对提高器件可靠性有积极意义.

This paper presents a method called TTSM (Three-Three Screening Method) to select optimal screening conditions for semiconductor devices. TTSM is so termed,because it requires three steps; accelerated life test is done under the stresses of over three grades; then three formulas-log-normal distribution, exponential distribution and Arr-henius relationship are used to handel with the test data and at last three diagrams are ploted based on the calculated values.

本文提出了一种选取半导体器件最佳筛选条件的统计方法.此法由于要在三种以上应力做加速寿命试验,要用到对数正态分布等三个数学方程,要作三张图,故将本法称之为TTSM(Three-Three Screening Method).它的具体内容是:根据用户或定型考核对器件的可靠性要求,将器件在三种以上高应力下进行加速寿命试验,然后根据加速寿命试验获得的数据,进行数理统计处理,从而选择出最佳筛选条件和筛选时间.TTSM抛弃了所谓筛选要剔除全部早期失效的管子这一难以确定的传统概念,把半导体器件筛选条件的选择建立在科学的统计计算的基础之上.TTSM已在去年WC 52双栅 FET的定型考核中用来选择筛选条件,所作预测与一千小时工作寿命考核结果一致.在WC50 FET生产考核中,所作预测与 500小时工作寿命考核结果一致.证明TTSM用来选择器件的最佳筛选条件和筛选时间是可行的.TTSM还可以预测在所选的筛选条件下剔除次品的百分比,为生产者和使用者在权衡数量和质量的得失时预先提供信息.

 
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