An algorithm for generating the complete test set of each stuck-at-0 (s-a-0) and stuck-at-1 (s-a-1) single fault in a combinational logic circuit is presented.
We investigate the characteristics of logic functions of the multiplexer and decoder which are two members in Medium Scale Integration (MSI) by some representative types of the questions and discuss the very things when we design the combinational logic circuit with MSI.
Taking the expanding of two three-bit priority encoders into one four-bit priority encoder for example and based on the traditional designing method of combinational logic circuit, the expanding functions of priority encoder are realized through the rigorous logical derivation, full use of constraint conditions and various means of logical simplification. Meanwhile, the designing methods to expand four three-bit prio- rity encoders into one five-bit priority encoder are put forward.
In the proposed way for generating full sequences a combinational logic circuit derived by the generated sequence is used to get the feedback signal,which can makes the length of a period of the sequences equal to 2n.
Yhe dynamic testing of combinational logic circuits is studied systematically, and the methods to generate the complete test set of a dynamically detectable fault as well as hazardously detectable statically undetectable fault are discussed in this paher. First, we find out a new and systematical approaoh to identify all hazards of a given logic circuit on the basis of "Four-Valued Logic and Star Algorithm" , then derive formalae of hazardous tests for single or multiple stuck-at faulls...
Yhe dynamic testing of combinational logic circuits is studied systematically, and the methods to generate the complete test set of a dynamically detectable fault as well as hazardously detectable statically undetectable fault are discussed in this paher. First, we find out a new and systematical approaoh to identify all hazards of a given logic circuit on the basis of "Four-Valued Logic and Star Algorithm" , then derive formalae of hazardous tests for single or multiple stuck-at faulls and for bridging faults which are undetectable statically, and a number of examples are taken,
In this paper the dynamic behaviors for Combinational logic circuits are investigated, the algebraic structures related to various hazards are set up, a new and systematical approach to identify hazards is proposed. It not only points explicitly out all transient input assignments to make the output of the logic networks to produce static o-hazard, static 1-haz-ard, dynamic step-down hazard, and dynamic step-up hazard, but also causes the number of transient input assignments which are needed to...
In this paper the dynamic behaviors for Combinational logic circuits are investigated, the algebraic structures related to various hazards are set up, a new and systematical approach to identify hazards is proposed. It not only points explicitly out all transient input assignments to make the output of the logic networks to produce static o-hazard, static 1-haz-ard, dynamic step-down hazard, and dynamic step-up hazard, but also causes the number of transient input assignments which are needed to be verified for differentiating a kind of hazard to reduce considerably. This technique could be easily implemented in a computer program.
The properties of Boolean difference are made use of to derive a new method for fault testing in combinational logic circuits. This method is simpler and different from the traditional one.