Fabricated in a CMOS/LDMOS process based on SDB/SOI substrate,the circuit contains a D/A converter,a dual-channel comparator,flip-flops,and combinational logic circuits,as well as over-frequency and over-voltage protection circuits.
This thesis introduces the application of Simulink in the teaching of the digital circuit in both theory and experiment, and concisely narrates its main properties through examples about Combinational Logic Circuits and Sequential Logic Circuits.
Yhe dynamic testing of combinational logic circuits is studied systematically, and the methods to generate the complete test set of a dynamically detectable fault as well as hazardously detectable statically undetectable fault are discussed in this paher.
One of the major factors which contribute to the power consumption in CMOS combinational logic circuits is the switching activities in the circuits.
Functional Fault Equivalence and Diagnostic Test Generation in Combinational Logic Circuits Using Conventional ATPG
We present a new diagnostic algorithm, based on backward-propagation, for localising design errors in combinational logic circuits.
A method for automatic design error location and correction in combinational logic circuits
In this paper we examine a range of gate delay models with respect to their impact on identifying both sensitizable paths and maximum circuit delays in combinational logic circuits.
Yhe dynamic testing of combinational logic circuits is studied systematically, and the methods to generate the complete test set of a dynamically detectable fault as well as hazardously detectable statically undetectable fault are discussed in this paher. First, we find out a new and systematical approaoh to identify all hazards of a given logic circuit on the basis of "Four-Valued Logic and Star Algorithm" , then derive formalae of hazardous tests for single or multiple stuck-at faulls...
Yhe dynamic testing of combinational logic circuits is studied systematically, and the methods to generate the complete test set of a dynamically detectable fault as well as hazardously detectable statically undetectable fault are discussed in this paher. First, we find out a new and systematical approaoh to identify all hazards of a given logic circuit on the basis of "Four-Valued Logic and Star Algorithm" , then derive formalae of hazardous tests for single or multiple stuck-at faulls and for bridging faults which are undetectable statically, and a number of examples are taken,
In this paper the dynamic behaviors for Combinational logic circuits are investigated, the algebraic structures related to various hazards are set up, a new and systematical approach to identify hazards is proposed. It not only points explicitly out all transient input assignments to make the output of the logic networks to produce static o-hazard, static 1-haz-ard, dynamic step-down hazard, and dynamic step-up hazard, but also causes the number of transient input assignments which are needed to...
In this paper the dynamic behaviors for Combinational logic circuits are investigated, the algebraic structures related to various hazards are set up, a new and systematical approach to identify hazards is proposed. It not only points explicitly out all transient input assignments to make the output of the logic networks to produce static o-hazard, static 1-haz-ard, dynamic step-down hazard, and dynamic step-up hazard, but also causes the number of transient input assignments which are needed to be verified for differentiating a kind of hazard to reduce considerably. This technique could be easily implemented in a computer program.
The properties of Boolean difference are made use of to derive a new method for fault testing in combinational logic circuits. This method is simpler and different from the traditional one.