A binary-working/ternary-testing (B/T for short) self-testing system is a special ternary logic system. Normally, it operates in binary mode, thus it is compatible with ordinary binary systems. The third logic value (the middle value) can be used as a fault indicating signal, or in off-line testing. B/T self-checking combinational systems have been studied in [1]. This paper extends the study to sequential systems. First, the structures of B/T R-S flip-flops,... A binary-working/ternary-testing (B/T for short) self-testing system is a special ternary logic system. Normally, it operates in binary mode, thus it is compatible with ordinary binary systems. The third logic value (the middle value) can be used as a fault indicating signal, or in off-line testing. B/T self-checking combinational systems have been studied in [1]. This paper extends the study to sequential systems. First, the structures of B/T R-S flip-flops, B/T D flip-flops and B/T J-K flip-flops are given. Then their fault characteristics are analysed. Finally, a general conclusion on B/T self-checking sequential systems is drawn. |