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circuit performance analysis
相关语句
  电路性能分析
     This paper also discusses a circuit parameter estimate method based on mixed-signal circuit performance analysis.
     本文给出了一种基于混合电路性能分析的电路参数估计的方法。
短句来源
     The available model of tradeoff optimization of yield and income is improved and a method of IC optimization design and yield forecast is presented. Based on the function and characteristic of statistic analysis and circuit performance analysis in OrCAD/PSpice9, the algorithm of IC optimization design and yield forecast is established.
     针对这一问题,本文完善了IC成品率效益协调优化设计模型,提出了一种实现该模型的IC优化设计和成品率预测方法,并利用OrCAD/PSpice中的统计分析和电路性能分析的功能和特点,建立了相应的算法。
短句来源
     The circuit principle modeling is based on the Hall law, and is propitious to the circuit performance analysis checkout for factory in early stage of equipment design.
     电路原理建模的解算依据是基于霍夫定律等,适用于生产厂家在装备设计初期对电路性能分析检验。
短句来源
  “circuit performance analysis”译为未确定词的双语例句
     Unlike previous reliability diagnosis and circuit performance analysis tools, Etsim3 can estimate the temperature distribution of the chip substrate and metal interconnects due to joule heating and heat conduction using electrothermal simulations with an analytical thermal model of the metal interconnections.
     该模拟软件考虑了集成电路自热效应,通过电热耦合模拟以及金属连线温度分布解析模型获得更准确的集成电路芯片表面以及各金属连线网络上的温度分布。
短句来源
  相似匹配句对
     Performance analysis on IGBT driving circuit
     关于IGBT驱动电路的性能分析
短句来源
     Analysis for feed—forward circuit performance
     前馈电路的性能分析
短句来源
     Analysis of Multiple Output Circuit's Performance
     复合输出回路性能分析
短句来源
     Analysis on the Performance of IGBT Driving Circuit
     IGBT 驱动电路性能分析
短句来源
     Performance Analysis of Input Circuit for Detectors
     红外焦平面探测器的输入电路性能分析
短句来源
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Circuit reliability and clock signal integrity are very important constraints in VLSI (very large scale integration) circuit designs. This paper describes a new electromigration reliability diagnosis and clock signal integrity analysis tool (Etsim3) for VLSI circuits. Unlike previous reliability diagnosis and circuit performance analysis tools, Etsim3 can estimate the temperature distribution of the chip substrate and metal interconnects due to joule heating and heat conduction using electrothermal simulations...

Circuit reliability and clock signal integrity are very important constraints in VLSI (very large scale integration) circuit designs. This paper describes a new electromigration reliability diagnosis and clock signal integrity analysis tool (Etsim3) for VLSI circuits. Unlike previous reliability diagnosis and circuit performance analysis tools, Etsim3 can estimate the temperature distribution of the chip substrate and metal interconnects due to joule heating and heat conduction using electrothermal simulations with an analytical thermal model of the metal interconnections. Simulation results show that Etsim3 provides more accurate predictions of the chip substrate and metal interconnects temperatures including the self-heating effect of VLSI circuit chips. Etsim3 uses the temperature-dependent distributed RC interconnect delay model and the classical Black's equation to provide more accurate clock signal integrity analyses and electromigration reliability diagnosis results.

为诊断大规模集成电路设计过程中电迁移可靠性及分析时钟信号完整性,开发一种用于集成电路片上时钟信号模拟软件Etsim3。该模拟软件考虑了集成电路自热效应,通过电热耦合模拟以及金属连线温度分布解析模型获得更准确的集成电路芯片表面以及各金属连线网络上的温度分布。模拟结果表明,考虑集成电路自热效应前后,电迁移诊断以及时钟信号完整性分析结果都有了较大程度上的改变,Etsim3可以得到更为精确的分析以及诊断结果。

Yield of IC is an important factor related with circuit performance , manufacturing cost and income, so the yield and income of IC is an optimization objective to compromise all circuit performance in IC optimization design. The available model of tradeoff optimization of yield and income is improved and a method of IC optimization design and yield forecast is presented. Based on the function and characteristic of statistic analysis and circuit performance analysis in OrCAD/PSpice9, the algorithm of IC...

Yield of IC is an important factor related with circuit performance , manufacturing cost and income, so the yield and income of IC is an optimization objective to compromise all circuit performance in IC optimization design. The available model of tradeoff optimization of yield and income is improved and a method of IC optimization design and yield forecast is presented. Based on the function and characteristic of statistic analysis and circuit performance analysis in OrCAD/PSpice9, the algorithm of IC optimization design and yield forecast is established. It is illustrated that the model and algorithm are effective.

IC成品率是与电路性能和制造成本及制造效益紧密相关的一个重要因素,在进行IC优化设计时,可将成品率与制造效益作为协调各性能指标的优化目标。针对这一问题,本文完善了IC成品率效益协调优化设计模型,提出了一种实现该模型的IC优化设计和成品率预测方法,并利用OrCAD/PSpice中的统计分析和电路性能分析的功能和特点,建立了相应的算法。实例表明,该方法及其实现算法是有效的。

The mechanism modeling methods of electronic weapon equipment includes circuit principle, signal oriented process, and operation phenomena and logic. The circuit principle modeling is based on the Hall law, and is propitious to the circuit performance analysis checkout for factory in early stage of equipment design. The signal oriented process chart is modeled by experts summarizing equipment, and is propitious to mechanism model design of equipment oriented simulation training system. Operation phenomena...

The mechanism modeling methods of electronic weapon equipment includes circuit principle, signal oriented process, and operation phenomena and logic. The circuit principle modeling is based on the Hall law, and is propitious to the circuit performance analysis checkout for factory in early stage of equipment design. The signal oriented process chart is modeled by experts summarizing equipment, and is propitious to mechanism model design of equipment oriented simulation training system. Operation phenomena and logic model carries out from the top level. It expresses different operation callings of equipment operation panel. And it can not contact with the internal signal electric relationship. So, it is hard to realize for the large-scale electronic equipment.

电子武器装备机理模型建立,有电路原理、面向信号流程、操作现象与逻辑等3种方法。电路原理建模的解算依据是基于霍夫定律等,适用于生产厂家在装备设计初期对电路性能分析检验。面向信号流程图建模通过专家将装备抽象总结,适合于面向装备的模拟训练系统机理模型设计。操作现象与逻辑模型则从顶层着手,是将装备操作面板不同操作响应尽量表达,完全绕开装备内部各种信号电气关系,对于大型电子装备实现难度较大。

 
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