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receiving slit
相关语句
  相似匹配句对
     Receiving Systems
     接收系统
短句来源
     Slit Lamps
     裂隙灯
短句来源
     as well as the receiving system.
     回收系统。
短句来源
     The Analysis of the Slit Filter
     对狭缝的滤波分析
短句来源
     Comparatively, with the reducing of shrinkage ratio of slit, the shock loads of receiving pool reduce, but the critical hydraulic head that just can cause deflecting heightens simultaneously.
     相对而言,随着窄缝收缩比的减小,水垫塘冲击荷载略有减小,但同时起挑水头增加。
短句来源
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  receiving slit
The linear motions of the crystal and receiving slit including the detector assembly are achieved by employing software-controlled DC motors and utilizing optical encoders for position sensing.
      
Only two translational motions are required to achieve the necessary Rowland circle configuration for the (fixed) X-ray source, the dispersing and focusing bent crystal and the receiving slit.
      
The slits used consisted of 1-degree fixed divergence and anti-scatter slits and a 0.2-mm receiving slit.
      
In all cases only the width of the receiving slit, its length and the crystallite size were refined when fitting the reference profiles.
      
A divergence slit angle of 1y28 and a receiving slit of 0.2 mm were used.
      


An Ω-goniometer Las been widely used on X-ray diffractometer tomeasure the stresses in polycrystalline materials.In this paper,the possible systematic errors due to casual arrangements of divergent slit,received slit and anti-scatter slit are evaluated with a standard stress-free sample.It is found that for the obtained stress value the application of divergent slit with large width will introduce negtive or positive errors in or measurements.This effect can hardly he eliminated by averaging...

An Ω-goniometer Las been widely used on X-ray diffractometer tomeasure the stresses in polycrystalline materials.In this paper,the possible systematic errors due to casual arrangements of divergent slit,received slit and anti-scatter slit are evaluated with a standard stress-free sample.It is found that for the obtained stress value the application of divergent slit with large width will introduce negtive or positive errors in or measurements.This effect can hardly he eliminated by averaging those two stress values.Contrary to divergent slit,the received slit has nearly no influence on a relative displacement of diffraction profile.For stress measurement with stationary slits,the effect of sample setting error is often emphasized,but the experimental results in this paper indicates that the limit setting error may be neglected if the slit effect is excluded beforehand by a standard stress-free sample,

针对Rigaku公司的Dmax系列X射线衍射仪,研究了准聚焦光学系统下,DS/RS/SS光阑配制及试样设置偏差对常规法应力测量精度的影响。确定了优化的光阑配置参数,并排除光阑的作用对试样设置偏差的影响作了正确评价。

Based on the analysed result, there established a curve relationship between the receiving slit (Rs) of a diffractometer and FWHM, i. e. FWHM = ARs2 + BRs + C. The methods based on Wang's formulae (1994) to evaluate the error levels caused by the scanning speed and step size in FWHM and maximum intensity of an XRD peak were described. These errors induced by the step size and scanning speed should be below 5 %. Reviews of sample preparation, X-ray diffraction setting and the role played by interlaboratory...

Based on the analysed result, there established a curve relationship between the receiving slit (Rs) of a diffractometer and FWHM, i. e. FWHM = ARs2 + BRs + C. The methods based on Wang's formulae (1994) to evaluate the error levels caused by the scanning speed and step size in FWHM and maximum intensity of an XRD peak were described. These errors induced by the step size and scanning speed should be below 5 %. Reviews of sample preparation, X-ray diffraction setting and the role played by interlaboratory IC standards were given, involving (1) determining sample geometric conditions, choosing optimum instrumental settings and using interlaboratory illite crystallinity standards are the most important procedures in the measurement of illite crystallinity; (2) the IC value from the same sample will vary with the changes of such geometric conditions and instrumental settings; (3) IC values without correction for the IC standards (Kisch, 1991, Warr et al. , 1994) cannot be comparable with each other and (4) this will mislead the research when the boundaries of the anchizone are derived from these uncorrected IC values.

根据实验结果,衍射峰半高宽随接收狭缝增大而呈二次曲线线性增大。扫描速度与扫描步长的确定应遵守wang(1994)提出的关系式,并确定在相对误差小于<5%的范围内。固定样品条件,选定最优实验条件和使用国际标样标定系统偏差是伊利石结晶度测量中必不可少的重要步骤。不固定样品条件和实验条件,同一样品的伊利石结晶度值将因条件的变化而不同;固定样品和实验条件而不使用国际标样标定系统偏差,则无法与他人数据进行对比,其结果常常错划近变质带的上下界限,造成成岩/变质界限及近变质/浅变质界限的混乱。

 
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