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自测试     
相关语句
  self-test
     The CAN controller module of TMS320LF2407A was introduced and its self-test mode, the priority to transmit and receive message of its mailboxes and the transmission and receiving of the remote frame were discussed in this paper.
     介绍了TMS320LF2407A的CAN控制器模块,分析了CAN控制器模块的自测试模式、邮箱发送和接收报文的优先级以及远程帧的发送和接收。
短句来源
     2. The research and develop of the boot-up program for LPC2000. And the development of CAN driver: self-test program and acceptance filter program's development have been finished.
     2.完成了LPC2000系列启动代码的研究与开发,CAN驱动程序:自测试程序,验收滤波程序的开发等。
短句来源
     A new crosstalk self-test method using the Maximal Aggressor Fault (MAF) model is proposed in this paper.
     本文利用最大侵扰故障MAF(Maximal Aggressor Fault)模型,提出了一种SoC芯片中总线串扰故障的自测试方法。
短句来源
     Parallel Feedback Built-In Self-Test Scheme
     并行反馈内置自测试设计方案
短句来源
     A method that carries out self-test under hardware is paid attention.
     一种越来越受到注意的方法是内建自测试(Built in Self Test,BIST)—也就是在硬件本身中实现自测试
短句来源
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  self-testing
     Design of an Online Self-testing System With ASP
     基于ASP技术的网上自测试系统的设计
短句来源
     The paper introduces the basic theory of interval mathematics, based on which the paper presents a criterion that diagnoses the fault of tolerant circuits and the self-testing conditions and mutual-testing conditions that diagnose the fault of tolerant subnetwork. It solves the problem that the faults of tolerant circuits are diagnosed
     本文对区间数学的基本理论进行了介绍,提出了基于区间分析法的判定容差电路状态的判据和判定容差子网络状态的自测试条件和互测试条件,从而解决了容差电路故障的误诊断或无法诊断的问题,而且计算简单,容易实现,为诊断容差电路的故障提供了一种有效的方法。
短句来源
     Microprocessor Self-testing and Design of Fault-tolerance
     微处理器的自测试和容错设计
短句来源
     in software design, the object-oriented testing programs and functional self-testing programs respectively apply Visual Basic and Assembly Language.
     在软件设计上,采用Visual Basic语言和汇编语言分别编制了PC机上的系统控制主程序和功能自测试程序。
短句来源
     EXPDORING A SELF-TESTING METHOD FOR MICROCOMPUTER SYSTEM
     微机系统自测试方法的探索
短句来源
更多       
  self test
     Built-in Self Test Design for PLA
     可编程逻辑阵列嵌入自测试设计
短句来源
     This paper focuses on the IP design of 1752,mainly on the I/O controland built-in self test of the 1750A system.
     本论文研究的课题是1752芯片的研究,主要研究1750A系统输入输出控制及自测试程序的研究。
短句来源
     A modified 13N algorithm for dualport embedded SRAM with complexity of O(n) is presented in the paper With 13N test algorithm and the modified algorithm, a flexible builtin self test (BIST) architecture is designed to test several singleport and dualport SRAM's in the chip
     该测试算法的复杂度为O(n),具有很好的实用性。 作为一个实际应用,通过将该算法和13N测试算法实现于测试算法控制单元,完成了对片内多块单端口SRAM和双端口SRAM的自测试设计。
短句来源
     The system has other functions,such as image display of the bar's cross section,information memory,data analysis,self test and calibration and so on.
     介绍了该系统的线材横截面图像显示、信息存储、数据分析、自测试和校验等功能。
短句来源
     It discusses the architecture of testbench in functional verification of DTV chip and detailed accounts realization of memory BIST (Build In Self Test) method.
     本章介绍了各种主流验证测试方法,着重叙述了DTV芯片中功能验证的平台结构设计和存储器内建式自测试(BIST)的具体实现。
短句来源
更多       
  self testing
     This paper introduces some basic concepts and modeling methods in low power testing, analyzes the causes of increased power consumption, discusses some current practices of power optimization, and finally presents an at speed low power self testing method for the high performance microprocessor.
     首先介绍低功耗测试技术中的基本概念和功耗建模方法 ,分析测试过程中功耗升高的原因 ,对已有的几种主要的降低测试功耗方法进行详细分析 ,最后给出一种高性能微处理器的真速低功耗自测试方法
短句来源

 

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      self-test
    Using derived discriminant functions, saline lands with different historical years of reclamation were classified with an overall accuracy of 86.6% in a self-test and 89.3% in a cross validation.
          
    Based on the built-in self-test for logic circuit, a new approach is proposed to reduce pseudorandom test length.
          
    The TSI Belief Scale (TSI-BSL) measures VT; the Compassion Fatigue Self-Test (CFST) for Psychotherapists measures STS.
          
    In order to develop and validate the index for use in low SES older adults, the 24-item Health and Human Services HealthStyle Self-Test was used for item generation.
          
    These self-tests, however, are not absolutely reliable as system defects will influence the self-test mechanism.
          
    更多          
      self-testing
    Self-Dual Self-Testing Multicycle Circuits: Their Properties
          
    A distributed self-testing method is designed for multi-computer systems of arbitrary mutual test graph.
          
    Self-Testing Automaton Networks: Their Design in Programmable Logical Matrices
          
    The design of self-testing synchronous automaton networks in a base of programmable logical matrices is studied.
          
    A self-testing checker based on the 1-out-of-3 code was described.
          
    更多          
      autonomous testing
    Determination of sample sizes for autonomous testing of components with different reliabilities in sequential systems
          
    We consider the problem of determining requirements for autonomous testing of a system containing components of different reliabilities.
          
    A semi autonomous Testing and Certification Board was established and supported by a HR Task force.
          
    Thus, the verification principle stands for autonomous testing and verification performed by the robot and for the robot.
          
    The autonomous testing and fault handling strategy presented above is an efficient, robust mechanism for detecting defects in a Cell Matrix substrate.
          
      self test
    Built-in self test of S2I switched current circuits
          
    This article presents a new concept for built-in self test of switched current circuits based on S2I memory cells.
          
    HIST: A hierarchical self test methodology for chips, boards, and systems
          
    This article presents the HIST approach, which allows the automated insertion of self test hardware into hierarchically designed circuits and systems to implement the RUNBIST instruction of the IEEE 1149.1 standard.
          
    The approach is able to detect all those faults, which are in the scope of the underlying self test algorithms.
          
    更多          
      其他


    In this paper, we discuss the self-checking problem PLA pea and

    本文提出了具有一定容错功能的自测试PLA及其相应检测器的设计,不论是实现函数的PLA或是检测器出现任何单故障,要么故障被检测出来,要么它被屏蔽,决不产生影响输出而又检测不出的故障,保证了线路的正常工作。

    A method of fault location using MPDS (Minimum path Difference Set) for self-testing microcomputer system is presented in this paper.Based on the sufficient analysis of microcomputer hardware, the flows of data or control can be helpful for fault modeling. Test generation is described by MPDS. The aim is that fault is located at IC' chip as accurate as possible.

    本文提出最小路径差集定位法,对微机系统的自测试问题进行了探索。在对微机系统硬件结构充分分析的基础上,根据所建立的故障模型,分别用数据流或控制流的最小路径差集产生测试方法,尽量使故障定位到片(IC'chip)。

    This paper firstly points out the relationship between testing and

    本文首先指出测试与超大型集成电路间的关系,尔后谈及若干测试方面的问题。例如,测试生成、故障模拟、测试应用以及内部自测试设计。另外还论述了关于这些领域的检验技术.

     
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