The CAN controller module of TMS320LF2407A was introduced and its self-test mode, the priority to transmit and receive message of its mailboxes and the transmission and receiving of the remote frame were discussed in this paper.
The paper introduces the basic theory of interval mathematics, based on which the paper presents a criterion that diagnoses the fault of tolerant circuits and the self-testing conditions and mutual-testing conditions that diagnose the fault of tolerant subnetwork. It solves the problem that the faults of tolerant circuits are diagnosed
A modified 13N algorithm for dualport embedded SRAM with complexity of O(n) is presented in the paper With 13N test algorithm and the modified algorithm, a flexible builtin self test (BIST) architecture is designed to test several singleport and dualport SRAM's in the chip
This paper introduces some basic concepts and modeling methods in low power testing, analyzes the causes of increased power consumption, discusses some current practices of power optimization, and finally presents an at speed low power self testing method for the high performance microprocessor.
Built-in self test of S2I switched current circuits
This article presents a new concept for built-in self test of switched current circuits based on S2I memory cells.
HIST: A hierarchical self test methodology for chips, boards, and systems
This article presents the HIST approach, which allows the automated insertion of self test hardware into hierarchically designed circuits and systems to implement the RUNBIST instruction of the IEEE 1149.1 standard.
The approach is able to detect all those faults, which are in the scope of the underlying self test algorithms.
A method of fault location using MPDS (Minimum path Difference Set) for self-testing microcomputer system is presented in this paper.Based on the sufficient analysis of microcomputer hardware, the flows of data or control can be helpful for fault modeling. Test generation is described by MPDS. The aim is that fault is located at IC' chip as accurate as possible.