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掠入射x射线反射
相关语句
  grazing incident x-ray reflectivity
     Grazing incident X-ray scattering techniques,including the methods of the grazing incident X-ray diffraction,grazing incident X-ray reflectivity,the random grazing incident X-ray scattering,have been reviewed in this article.
     描述了掠入射X射线散射的基本方法,包括掠入射X射线衍射、掠入射X射线反射和掠入射X射线漫散射方法。
短句来源
     Grazing incident X-ray reflectivity measurements,together with off-specular and transverse scattering experiments show that there exists a mid-layer at all interface between YBCO and LCMO.
     掠入射X射线反射结果表明,YBCO/LCMO的界面有互扩散,其扩散长度为几个纳米。
短句来源
  相似匹配句对
     Analyses of reflectivity of grazing incident X-ray microscope
     入射X射线显微镜反射率分析
短句来源
     Grazing incident X-ray scatter techniques
     入射X射线散射方法与应用
短句来源
     Numerical simulation of x-ray lasers pumpedby grazing incidence pulses
     入射驱动产生x射线激光的数值模拟
短句来源
     High Resolution Grazing Incidence Soft X-ray and VUV Monochromator
     高分辨入射X射线-真空紫外单色仪
短句来源
     Grazing Incidence Grating Spectrograph for Low Energy X-Ray Region
     用于低能X射线段的入射光栅摄谱仪
短句来源
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  grazing incidence x-ray reflectivity
The effect of varying the laser power on the film microstructure has been investigated using grazing incidence X-ray reflectivity measurements.
      
Surfaces of soda-lime glass and borosilicate glass have been investigated by grazing incidence X-ray reflectivity (GIXR).
      
The roughness of the interface was also measured using grazing incidence x-ray reflectivity (GIXR).
      
In this paper we report grazing incidence x-ray reflectivity and diffuse scattering studies on these same wafers.
      


Grazing incident X-ray scattering techniques,including the methods of the grazing incident X-ray diffraction,grazing incident X-ray reflectivity,the random grazing incident X-ray scattering,have been reviewed in this article.The experimental configuration in lab for grazing incident X-ray scattering has also been described.Several examples for the use of the grazing incident X-ray scattering techniques have given.

描述了掠入射X射线散射的基本方法,包括掠入射X射线衍射、掠入射X射线反射和掠入射X射线漫散射方法。还对实验室进行掠入射X射线散射的实验几何进行了描述,并给出X射线掠入射方法在纳米薄膜材料研究中的应用。

Sandwiched YBa_2Cu_3O_(7-δ)(YBCO)/La_(0.67)Ca_(0.33)MO_3(LCMO)/YBCO films were fabricated by rf-magneton sputtering technique.X-ray diffraction studies show that all films are(001) orientation.Grazing incident X-ray reflectivity measurements,together with off-specular and transverse scattering experiments show that there exists a mid-layer at all interface between YBCO and LCMO.The thickness of this mid-layer varies with the thickness of YBCO.The roughness of each layer is also characterized,and it may be related...

Sandwiched YBa_2Cu_3O_(7-δ)(YBCO)/La_(0.67)Ca_(0.33)MO_3(LCMO)/YBCO films were fabricated by rf-magneton sputtering technique.X-ray diffraction studies show that all films are(001) orientation.Grazing incident X-ray reflectivity measurements,together with off-specular and transverse scattering experiments show that there exists a mid-layer at all interface between YBCO and LCMO.The thickness of this mid-layer varies with the thickness of YBCO.The roughness of each layer is also characterized,and it may be related to the misfit strain relaxation in film.

用磁控溅射方法生长三明治结构的YBa2Cu3O7-δ/La0.67Ca0.33MnO3/YBa2Cu3O7-δ(YBCO/LCMO/YBCO)薄膜。该薄膜为完全(001)取向。掠入射X射线反射结果表明,YBCO/LCMO的界面有互扩散,其扩散长度为几个纳米。表层与界面的方均粗糙度(rms)随着YBCO层的厚度而变化,这与原子力显微镜的测量结果一致;进一步研究表明方均粗糙度与薄膜的失配应变弛豫相关。

Different As-soak time is applied during InSb-like interfaces growth of InAs/AlSb superlattices on GaAs(100)substrates.The interface roughness is studied by grazing incidence X-ray reflectivity.The reflectivity curves are simulated by standard software and the rms roughness of the interfaces is obtained.It was shown that the sample with As-soak time of 20 seconds has the most smooth interfaces.By analyzing the microscope images of the samples,we suggest that In-rich interfaces will be formed with too short As-soak...

Different As-soak time is applied during InSb-like interfaces growth of InAs/AlSb superlattices on GaAs(100)substrates.The interface roughness is studied by grazing incidence X-ray reflectivity.The reflectivity curves are simulated by standard software and the rms roughness of the interfaces is obtained.It was shown that the sample with As-soak time of 20 seconds has the most smooth interfaces.By analyzing the microscope images of the samples,we suggest that In-rich interfaces will be formed with too short As-soak time and AlAs-like interfaces are obtained with too long As-soak time,and in hoth cases the interface will be cearsened.Grazing incidence X-ray reflectivity is also recommended as a powerful tool for assessing the structure of superlattices.

用分子束外延设备(MBE)在GaAs(100)衬底上生长了InSb型界面的AlSb/InAs超晶格,界面生长过程中采用了As保护下不同的中断时间.运用掠入射X射线反射技术(GIXRR)对样品进行了测量,并对测量结果进行了模拟和分析,发现As保护下生长中断20s能获得最平整的AlSb/InAs界面.结合分析显微镜下观察到的样品形貌,过短的界面中断时间会导致界面富In并形成In点,而过长的中断时间会导致AlAs型界面的形成,两者都使界面变得粗糙.另外,还讨论了生长中断在分子束外延生长中的应用.

 
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