Zinc oxide (ZnO) films with c-axis orientation have been prepared on the room temperature substrates by a reactive sputtering deposition utilizing electron-cyclotron-resonance multipolar (ECRM) plasma appartus built with Nd-Fe-B magnets and 2. 45 GHz, TE10 mode microwave.
LiNbO_3 thin films on amorphous SiO_2 buffer layer were composed of intimate arrangements of quadrangular single crystal domain (150×150 nm) with c-axis orientation, and display sharp interface structures.
C-axis oriented Ba_(0.5)Sr_(0.5)TiO_3 (BST) thin film was then grown on the LSCO film. The dielectric constant of the films were about 110, loss tangent were 0.06, and large dielectric tuning (>50%) was achieved.
Various methods to prepare the ZnO thin films were reviewed. The main factors influencing the structure of ZnO thin film were introduced. At the same time, the high quality, ZnO thin film growed at C axis orientation on silicon substrate by DC reactive magnetron sputtering was described.
The results indicated that when the sputtering power is 100 W and the substrate temperature is 300-400°C, it is suitable for the growth of high c-axis orientation and small strain ZnO films.
Changes of the C-axis orientation may also lead to a frequency shift of the surface polariton mode, allowing for tuning on or off the resonant coupling, resulting in a special type of engineering of surface forces.
The strong preferential c-axis orientation perpendicular to the substrate surface has been observed in the YBa2Cu3O7-δ/Ag/?ZrO2? samples.
The HTSC films obtained on (100)ZrO2 showed Tc(R=0)=90 K, ΔT(90-10%)=0.5 K, jc=2.5 × 106 A/cm2, a sharp transition in the ac susceptibility X(T), and pure c-axis orientation.
When the repetition frequency is lowered, the degree of c-axis orientation is increased in both films.
The ageing of the reaction mixture reduces the growth rate of mordenite crystal along a-axis and b-axis but hardly influences the growth rate along c-axis.
With increasing the amount of salt, there was hardly influence on the growth rate along c-axis, whereas an obvious decline was observed in the growth rate along either a-axis or b-axis, which enlarges the boundaries between the surface crystals.
The growth rate of the mordenite crystal increases more along c-axis than that along a-axis or b-axis with increasing temperature for hydrothermal crystallization.
The X-ray diffraction (XRD) indicates that it is highly (101) and c-axis oriented.
The analysis of spin snapshots demonstrates that the AFM bond doping not only breaks the ferromagnetic ordered linear spin chains along the hexagonal c-axis but also has a great influence upon the spin configuration in the ab-plane.
Through the X-ray diffraction of poled composite thin film, it was obtained that the c axis orientation ratio η of nano-crystal PbTiO3 was calculated to be 68%.
X-ray diffraction patterns (θ - 2θ scans) showed that the thick films prepared on LaAlO3(100) substrates consisted mainly of the (Tl,Bi)-1223 phase, with high c axis orientation, and φ scans revealed epitaxial film growth.