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束流
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  beam current
    270° bending magnet prototype combined with 14 MeV electron standing wave linear acceleration tube is under beam test. Experimental results show that electron beams in an energy range of 6 - 14 MeV and different initial emittances are exposed to achromatic and focus action. When transported into target position beam current intensity is 3. 5 mA at 15. 1 MeV. Beam fleck diameter is about 2 mm.
    270°偏转 磁铁样机与加速管联合进行了出束试验,测试结果表明,具有 6~14 MeV能量范围、不同的初 始发射度的电子束流,通过270°偏转磁铁系统受到消色散和聚焦作用,传输到靶点在能量15.1 MeV时,束流强度为3.5mA,束流斑点直径约为2mm。
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  “束流”译为未确定词的双语例句
    For measuring the number of incident proton,an Au(Si) surface barrier detector was employed to acquire the RBS spectrum of the 175 nm Au foil in the RBS chamber.
    在外束管道前的RBS靶室中放置175nm金箔和金硅面垒探测器,可在外束PIXE分析的同时,用Au的RBS峰面积来监测束流积分。
短句来源
    A kind of TOF telescope has been developed. Its mass resolution A/△A,time resolution, energy resolution and Charge resolution Z/△Z for 25 MeV/A 40 Ar ions are 67, 344ps, 0.8% and 46 respectively.
    研制了一种飞行时间望远镜,其组成为ScintillatorFoil+PPAC+IC+Si,用25MeV/A40Ar束流在线测量,电荷分辨Z/△Z(FWHM)=46,质量分辨A/△A(FWHM)=67,时间分辨为344ps,能量分辨为0.8%.
短句来源
    METHODS OF MEASURING DISTORTED PHASE SPACE DIAGRAMS OF PARTICLE BEAMS
    畸变的束流相图的测量方法
短句来源
    In order to reduce the whole size and to increase the performance of the hydrogenatomic clock, we designed the quadrupole state selector to replace the hexapole stateselector.
    为了进一步减小氢脉泽的整体尺寸,有效利用原子束流,提高氢原子钟性能,我们设计了四极态选择器,对四极态选择器进行了最佳化设计,磁极内孔r_0=1mm,长度L_2=59mm,L_3=180mm。
短句来源
    The microroughness and topograhpy of the si(111)surfaces polished by Ar ̄+ion beams of various parameters have been investigated on nanometer scale by means of scanning force microscope(SFM). Ion polishingmethod has been proved to be effective for obtaining ultrasmooth surfaces.
    本文报道了用原子力显微镜(AFM)研究多种Ar ̄+离子抛光参数Si(lll)表面的微观粗糙度和三维微观形貌特征,发现用离子束抛光方法可以显著地改善硅片表面的微观粗糙度,抛光效果与离子束能量、束流强度、抛光时间和束流入射角度等有关。
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  beam current
The influence of proton irradiation (energy, 18 MeV; beam current, 300 nA) with doses of 5 × 1014, 1015, and 5 × 1015 cm-2 on samples of SiO2-BaO-based glass coatings is investigated.
      
It was shown that significant steady-state currents (1 to 10% of the electron beam current) were observed only if the thickness of blocking (unirradiated) layer did not exceed 5 μm.
      
It was found that depending on deposition conditions, the resistivity ρ of applied lines varied from 4 × 10-2 to 103 Ω cm, decreasing rapidly with an increase in the electron beam current.
      
The Simulation of a Beam-Plasma Discharge with the Beam Current Exceeding the Limiting Vacuum Current
      
Results are given of simulation of the space-time dynamics of a beam-plasma discharge with the beam current exceeding the limiting vacuum current.
      
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In this paper a new long life high brightness cathode-Y_2O_3-Ir sui-table for the electron microscope is introduced. Its characteristics of thermal emis-sion has been found to lie between Th-W cathode and LaB_6 cathode. The electrongun characteristics of this cathode have been measured as following: the beam cur-rent stability may reach 7×10~(-3) in 30s, the brightness may reach 2.8×10~5A/cm~2srthe cross over diameter is about 20μ. Its physical and chemical properties are ana-lysed. The reason of long life is...

In this paper a new long life high brightness cathode-Y_2O_3-Ir sui-table for the electron microscope is introduced. Its characteristics of thermal emis-sion has been found to lie between Th-W cathode and LaB_6 cathode. The electrongun characteristics of this cathode have been measured as following: the beam cur-rent stability may reach 7×10~(-3) in 30s, the brightness may reach 2.8×10~5A/cm~2srthe cross over diameter is about 20μ. Its physical and chemical properties are ana-lysed. The reason of long life is clarified. The manufacture technique of this catho-de and its situation of application to transmission electron microscope and scan-ning electron microscope are presented. Some of the phenomena about the mechanismof emission of Y_2O_3-Ir cathode and the preliminary analysis are given. Finally, theprospect of application of the cathode to electron microscope and other electronoptical instruments is discussed.

本文介绍了一种适宜于电子显微镜用的高亮度长寿命的新阴极Y_2O_3-1r。测量其热发射特性:介于Th-W阴极与LaB_6阴极之间。测量其电子枪特性:束流稳定度可达7×10~(-3),亮度可达3×10~5A/cm~2·sr,交叉斑直径约为20μ。根据对其物理化学性能的分析,阐明了寿命长的根据。本文并介绍这种阴极的制造工艺及在透射式电子显微镜和扫描电子显微镜上应用的情况。最后讨论了这种阴极在电子显微镜上应用的前景。

The Combined Plane-Cylindrical Mirror Analyzer (PCMA) hag the advantage of high transmission and the possibility of second-order focusing, just like the conventional cylindrical mi ror analyzer (CMA). In the POMA all fountain electrons emitted from the specimen (electron source) on the cylinder's ooaxis will be focused behind the specimen on the axis after travelling through 180 degrees. By using PCMA as the electron energy analyzer in a scanning electron microscope (SEM), the working distance of the SEM magnetic...

The Combined Plane-Cylindrical Mirror Analyzer (PCMA) hag the advantage of high transmission and the possibility of second-order focusing, just like the conventional cylindrical mi ror analyzer (CMA). In the POMA all fountain electrons emitted from the specimen (electron source) on the cylinder's ooaxis will be focused behind the specimen on the axis after travelling through 180 degrees. By using PCMA as the electron energy analyzer in a scanning electron microscope (SEM), the working distance of the SEM magnetic objective lens could be shortened, and its spherical abberation reduced as compared with non-ooaxial gun type CMA, thus the primary electron beam current density could be increased. As a result, the sensitivity of the Scanning Anger Mioroprobe (SAM) might be enhanced. Furthermore, the structure within the irrer cylinder of PCMA is much simpler than the conventional CMA with coaxial gun.

本文所讨论的复合板筒镜电子能量分析器,和通用的筒镜分析器一样,具有二级聚焦和传输率高的优点.其主要特点是:当一次入射束垂直入射于试样表面,激发出的次生电子以喷泉状通过弯曲的轨道绕过试样,重新会聚到试样背后的对称轴上.因此,在用于电子枪位于分析器外的扫描俄歇电子显微镜中作俄歇电子能谱仪时,可以缩短电磁物镜的工作距离,减小物镜的球差系数,增加一次电子束流密度,从而提高俄歇分析的灵敏度.其次,与电子枪在内筒中的简镜分析器相比,可以简化内筒的结构,并便于电子枪的调整.

The methods of measuring phase space diagrams of particle beams are

用缝针法和孔针法来测量束流相图的结果往往不同,本文讨论了这两种方法的关系,说明了不宜于用缝针法来测量由于象差而产生严重畸变的束流相图,并提出了一种改进的测量方法——单孔移位、逐点测量法,且用此方法测得了畸变成S 型的束流相图.

 
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